Hennemann, "Current induced degradation of isotropically conductive adhesives," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 21, pp. 259-265, June 1998.S. Kotthaus et al., "Current-Induced Degradation of Isotropically Conductive adhesives", IEEE Trans. on CPMT, Vol. 21, No.2...
Current-induced degradation of isotropically conductive... S. Kotthaus et al., "Current-Induced Degradation of Isotropically Conductive adhesives", IEEE Trans. on CPMT, Vol. 21, No.2, pp.259- 265, June ... Kotthaus,Stefan,Haug,... - 《IEEE Transactions on Components Packaging & ...
Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts to n -Type SiC for High-Temperature Gas Sensors We investigated the thermal stability of Pt/TaSi x /Ni/SiC ohmic contacts, which have been implemented in SiC-based gas sensors developed for ap... Ariel,Virs...
Light-induced degradation and light-induced degradation after current-induced degradation of several types of a-Si solar cells were compared in order to investigate the difference between current-induced degradation and light-induced degradation. Very little difference in the efficiency after long-term li...
Leakage-current-induced hot-carrier effects have been observed during stressing of p-channel MOSFETs in the OFF state with V/sub GS/>0 V and V/sub DS/<0 V. This mode of stressing results in increased leakage current and a positive shift in the value of V/sub GS/, corresponding to the...
GIDL current degradation in LDD nMOSFET under hot hole stress The degradation of gate-induced drain leakage (GIDL) current in LDD nMOSFET under hot holes stress is studied in depth based on its parameter I_(DIFF). I_(... LDH Chen - 《Journal of Semiconductors》 被引量: 0发表: 2011年...
Within this paper we investigate the degradation of GaN-HEMTs with p-GaN gate submitted to stress at forward gate bias. We studied the effect of both constant-voltage stress and short-pulse stress (induced by TLP, Transmission Line Pulser); devices having three different Mg-doping levels (rang...
Erratic degradation and circuit effects induced by TID in a typical current feedback amplifier 来自 掌桥科研 喜欢 0 阅读量: 16 作者:S Perez,L Dusseau,YG Velo,JR Vaille,R Ecoffet 摘要: The impact of Total Ionizing Dose on a typical current feedback amplifier, the AD844 irradiated with 60...
The main aim of this review was to showcase the recent progress of atrazine degradation methods, along with their main advantages, disadvantages, potential efficiency, and degradation pathways. The overall goal was to create an information gateway for researchers, and stakeholders interested in ...
Mitochondrial cytochrome P450 (CYP) 1B1 is responsible for melatonin-induced apoptosis in neural cancer cells J Pineal Res, 65 (2018), Article e12478 View in ScopusGoogle Scholar 7 M. Ruwali, A. Dhawan, M.C. Pant, Q. Rahman, S.M. Khurana, D. Parmar Clinical management of head and ...