XRD卡片中的6CuO!Cu2O代表什么物质？发自小木虫Android客户端
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Fig. 1: Structure, XRD patterns and SEM imaging of the Cu2O photocathodes. aA schematic illustration of the structure of the Cu2O photocathode with dual buffer layers (Ga2O3and ZnGeOx).bXRD patterns of the different films. The diffraction peaks marked with hearts, clubs and diamonds belong to...
We have engineered the electronic structure at the interface between Cu2O and ZnO nanorods (NRs) array, through adjusting the carrier concentration of Cu2O. The electrodeposition of Cu2O at pH 11 acquired the highest carrier concentration, resulting in t
Next to the PEC measurements, the photoelectrochemical stability of the Cu2O films before and after PEC measurements was evaluated by XRD and SEM. For analysis of the crystal structure of Cu2O and the presence of Cu and/or CuO in the Cu2O layers, a Bruker D2 powder diffractometer (equipped ...
Fig. 2. In-situ time-resolved XRD analysis of the thermal oxidation of 300-nm-thick Cu films to single phase of Cu2O and CuO in 20 vol%–O2 / Ar. (a,c) False color in-situ X-ray diffraction (λ = 0.4921 Å) maps for the oxidation at 300 °C and 400 °C, respectively. (...
(XRD) as shown in Fig.1a, b. Both films show diffraction peaks that are indexed to the rhombohedral β-CuSCN (JCPDS No. 29-0581). No impurity peaks are visible other than those of fluorine-doped tin oxide (FTO) substrates (marked with asterisks, JCPDS No. 01-077-0451). While the ...
. Nano-structured CuO-Cu2O complex thin film for application in CH3NH3PbI3 perovskite solar cells.11, 402 (2016). ArticleADS Liu, Z.et al. p-Type mesoscopic NiO as an active interfacial layer for carbon counter electrode based perovskite solar cells.Dalton Trans.44, 3967–3973 (2015). ...
Apart from the XRD data, our cross-sectional TEM (see Fig. 2(c)) shows interlayer separation of 1.52 nm which corresponds to that of a half unit-cell for the 2212 phase. We have conducted temperature-dependent electrical measurements on multiple devices and all were found to possess the...
characterization. The crystal structures of the as-prepared samples were analyzed by X-ray diffraction (XRD) on a D/MAX-2004 X-ray powder diffractometer (Rigaku Corporation, Tokyo, Japan) with Ni-filtered Cu Kα (λ = 1.54178 Å) radiation at 56 kV and 182 ...