Cu K-alpha Jump to:navigation,search Copper K-αis anx-rayenergyfrequently used onlabscalex-ray instruments. The energy is 8.04 keV, which corresponds to an x-ray wavelength of 1.5406 Å. This causes the prefactor in thescatteringequation to be:...
De novo zinc single-wavelength anomalous dispersion (Zn-SAD) phasing has been demonstrated with the 1.9 resolution data of glucose isomerase and 2.6 resolution data of Staphylococcus aureus Fur (SaFur) collected using in-house Cu K alpha X-ray source. The successful in-house Zn-SAD phasing of ...
aextinction contours (GB1 in Fig. 4a), indicating a high level of internal stresses and elastic distortions[translate] awavelength of X-ray beam ( = 0.15406nm for Cu K radiation), ˇ[translate]
英语翻译The structure of the prepared samples was characterized by X-raypowder diffraction with Cu Kα radiation filtered by a crystalmonochromator (wavelength λ=0.15417 nm).The structure of the prepared samples was characterized by X-ray powder
where λ is the x-ray wavelength; β is the full width of the peak at half maximum (FWHM); θ is the Bragg angle (in radian). Dislocation density (δ) and microstrain (ε) were calculated using Equations (2) and (3), respectively [38]. δ = 1/D2 (2) ε = β/4tanθ (...
The structure and crystalline properties of the synthesized samples were examined via X-ray diffraction (XRD) employing a powder diffractometer (PAN Analytical X’ pert PRO Model X-ray diffractometer) and monochromatic Cu-Kα radiation (λ = 1.5418 Å). The sample was placed on a glass plate...
Here, k denotes the shape factor, λ represents the X-ray wavelength, θ is the Bragg angle, and βr denotes the relative peak broadening (βr = β02−βi2, where β0 denotes the FWHM of the measured intense diffraction peak, and βi denotes the FWHM (0.096o) of the intense diffr...
where λ = 0.1564 nm refers to the wavelength of the X-ray using the CuKα monochromatic radiation, while β and θ are the FWHM of the XRD sample peaks in radians and the Bragg’s angle of the diffraction peak, respectively. ...
OfCufilmsattheWavelengthis550nm 膜的光学常量l k 也具有明显的尺寸效应. 图 6 是利用型号为 SPA300~V 的 AFM 观察 得到的厚度为32.8nm 的 Cu 膜表面形貌像. 图6 图6 Cu 膜厚度为32.8nm 时的 AFM 表面形貌 像 Fig.6 AFMtOpOgraphYimagesOfCufilmsWith ...
C. The lattice fringes with an interplanar spacing of 0.201 nm were ascribed to the (400) facet of Co3O4. Besides, abundant Cu single atoms were observed around Co3O4nanosheets. Based on energy-dispersive X-ray spectroscopy (EDS) elemental mapping, Co, Cu, and N elements were ...