We introduced a method for monitoring the pressure baseline and integrating a routine correction to ion beam intensity measurements during every analysis. This correction dramatically improves long-term precision of 螖47 measurements to approach instrumental analytical uncertainty.He, Bo...
通过使用聚焦离子束(focused ion beam,FIB)从电极上制备了超薄样品,然后利用透射电子显微镜(transmission electron microscopy, TEM)和电子能量损失谱(electronenergy loss spectroscopy,EELS)研究了铜的不同价态的分布和演化。我们发现,无论...
To confirm that the reduction products be derived from CO2, the photoreduction of13C-labeled CO2was conducted over the IL/Co-bCN. The dominant peak of13CO (m/z = 29) and a small peak of13CH4(m/z = 17) were observed in the selective ion detection chromatography spectrum (Fig....
Studies of reactions of C3H+ ions in the gas phase at 296±2 K Rate constants and product distributions have been determined for ion-molecule reactions between C 3H + and H 2, D 2, CO, N 2, O 2, CO 2, OCS, H 2O, H 2S, CH 3OH, NO, N 2O, NH 3, ND 3, CH4, HCN, ...
The reaction of ground state chromium ions with ethane, ethene, cyclopropane and ethylene oxide has been studied using guided ion beam mass spectrometry. A... R Georgiadis,PB Armentrout - 《International Journal of Mass Spectrometry & Ion Processes》 被引量: 95发表: 1989年 ...
Self‐Supporting Carbon Thin Films Used in the Heavy‐Ion Beam Self-supporting carbon thin films are needed for the heavy-ion beam at the Gesellschaft f眉r Schwerionenforschung (GSI) as targets, as stripper foils, and ... W Thalheimer,W Hartmann,J Klemm,... - 《Crystal Research & Technol...
It may, however, be pointed out that in these reports31,32, the CFA thin films were deposited on MgO substrates and also required an additional process step of post-annealing at 600 °C. Here, we would like to mention the advantage of the ion beam sputtering (IBS) technique (employed...
C. Tsou, D. Röschenthaler, M. Ramin, H. Ryssel & I. Ruge 61 Accesses 23 Citations Explore all metrics Abstract CW CO2-laser annealing of arsenic implanted silicon was investigated in comparison with thermal annealing. Ion channeling, ellipsometry, and Hall effect measurements were ...
Abstract Interactions between \\{CO2\\} and SiO2 films thermally grown on Si have been studied using 18O and 13C as isotopic tracers associated with ion beam analysis (IBA) depth profiling techniques. From secondary ion mass spectrometry (SIMS) measurements no carbon from \\{CO2\\} is ...
Using a focused ion beam (FIB) microscope, we cut thin square-shaped lamellae of thickness d ≲ 1 μm from as-grown Co2MnGa single crystals (see Methods). Each sample contains just a few domains that form the familiar Landau flux-closure pattern19 on each face (Fig. 1d). ...