Dastoor, Methods in carbon K-edge NEXAFS: experiment and analysis, J. Electron Spectrosc. Relat. Phenom. 151 (2) (2006) 105e120.B. Watts, L. Thomsen, P.C. Dastoor, Methods in carbon K-edge NEXAFS: experiment and analysis, J. Electron Spectrosc. Relat. Phenom. 151 (2006) 105-120....
On the other hand, we observe only negligible variations in the intensity of the NEXAFS spectra (Fig. 2C, D), where the only significant change occurs in a restricted region of the C K-edge (green area, 286-287.1 eV), conveying the pivotal contribution of this carbon site to this...
Examination of the structure and melting behaviour of thin film n-alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy The use of ultra-soft near-edge X-ray absorption fine structure (NEXAFS) spectroscopy as a tool for determining the molecular orientations, and changes in ...
To confirm our supposition about the precursors of these preserved features (i.e., root hair-like structure or chemically distinctive from the C in surrounding regions), linear combination fitting of C K-edge NEXAFS spectra was carried out (Fig. 2). The root hair-like structure in the ...
C K-edge NEXAFS spectra d and e expanded view for D-C-X. f Defect models used for theoretical calculations, g DFT calculations for ECR activities of different defects [92]. Copyright © 2019, John Wiley & Sons, Inc. Magnification of one segment of the HRTEM image h1 and h2 after ...
Near-edge x-ray absorption fine structure (NEXAFS) spectra of the carbon K-edge of the DLC films formed by various methods were measured over the excitation energy range 275-320 eV, using synchrotron radiation. On the basis of the analysis of the peak corresponding the transition of the ...
thin filmsXANES/ K-NEXAFS spectralayer-by-layer analysiscarbon-based thin filmsSpectral separation methods for X-ray absorption fine structure spectroscopy at the near carbon K-edge are examined for an n-C36H74 monolayer adsorbed on a monolayer graphene grown on a Pt(111) surface. The spectra ...
The structure of acetylene adsorbed on Pd(111) below 200 K is probed using near-edge X-ray absorption fine structure (NEXAFS) and ultraviolet and X-ray ph... H.,Hoffmann,and,... - 《Surface Science》 被引量: 126发表: 1992年 Carbon K-Shell X-Ray Absorption Near-Edge Structure of Sol...
For each set point, the NEXAFS spectra at the carbon K-edge were recorded directly after XPS in the total electron yield (TEY) mode, using a positively polarized micro-channel plate detector (home-made detector with a 50 ohms adapted anode). The depth probed with the TEY method is about ...
In particular, by comparison with gaseous 1-octene, near-edge X-ray absorption fine structure (NEXAFS) suggested that approximately two-fifths of the adsorbates on the scribed and roughened silicon retained a carbon-carbon double bond, while one-fifth of those prepared on smooth silicon did (...