Interpretation of XPS spectra C-C peak at 284.8eV is frequently used a charge correction reference because of its convenience. Not always reliable, possibly changing with nature of the surface hydrocarbon, film thickness and nature of the sample. C1s spectra for polymers tend to have ...
The analysis of the XPS spectrum presented in Fig.3dis nontrivial. The spectrum shows a significant degree of surface contamination since the sample was exposed to air. No sp2contribution was detected that allows excluding any influence of graphitized fraction on the film properties, particularly on...
Evans S. (1997) Correction for the effects of adventitious carbon overlayers in quantitative XPS analysis. Surf. Interface Anal. 25, 924-930.S. Evans, Correction for the effects of adventitious carbon overlayers in quantitative XPS analysis, Surf. Interface Anal. 25 (1997) 924-930. doi:...
Thus, a correction factor X had to be applied (Supplementary Table 4, Supplementary Figs. 8 and 9), that the different CND samples had the same fluorescence I′ = X × I at the same concentration C′CND. Note that the correction factor X had to be determined in the cell ...
All the spectra were submitted to analyser transmission function correction using the QUASES Tougaard software [60]. The ratio of signal to noise in the first derivative X-ray excited C KLL spectra of carbon materials is low (Fig. 2a) and therefore the spectra require further smoothing for eva...
electron microscope scanner, fluid meter, gas meter, laser particle size analyzer, specific surface area and aperture analyzer, charge discharge detector, impedance tester, electrochemical workstation, mechanical performance testing equipment, scanning electron microscope, Raman, OM, AFM, XPS, ICP, UV Vi...
1c). After pre-reduction in the CsI-containing KOH electrolyte, the film shows metallic copper features with dominant Cu(100) and Cu(111) facets (Fig. 1a) and the disappearance of chloride from the XPS spectrum demonstrates the effective removal of residual chloride via pre-reduction (Fig. ...
2007年2月13日 CC Certificate of correction 2006年10月23日 AS Assignment Owner name: THE OHIO STATE UNIVERSITY RESEARCH FOUNDATION, OHI Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:THE OHIO STATE UNIVERSITY;REEL/FRAME:018422/0084 Effective date: 20061012 2004年7月15日 AS Assignment...
likely due to electron transfer from Ni to the more electronegative Ru in the RuNi nanoalloy, a finding that is consistent with the X-ray photoelectron spectroscopy (XPS) analysis (Supplementary Figs.14–16). The local coordination environment of Ni atoms in RuNi/NC was probed by Fourier tran...
As a Raman spectrometer, there was used Single Microscope Laser Raman Spectrometer T 64000 produced by JOBIN YVON Corporation. As an excitation light source, an Ar+laser (λ=514.5 nm) was used. The output of the Ar+laser was 20 mW. Baseline correction was made for the chart obtained, afte...