C KLL acquisition conditions: Pass energy=100eV, step size=0.5eV, 100 scans, scan range binding energy=1,190eV-1,246eV. Charge neutralization may be required, especially for functionalized graphene/graphite or diamond. Interpretation of XPS spectra ...
Interpretation of XPS Spectra The C1s spectrum from a sample with high concentration of sp2carbon will have a broad, asymmetric tail towards higher binding energy. One or more satellite features, several eV from the main C1s peak, will also be observed in samples with high sp2conc...
In all these materials, the sulphur atom environments are identical, corresponding to heterocyclic sulphur, 163.3 eV binding energy. Experimental binding energies are compared with those obtained using a charge-potential model from CNDO orbital calculations....
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XPS binding energies. Reproduced with permission from Ref. [76]. Copyright 2015, AAAS.e,fN 1sXPS spectra and the corresponded LSV curves of the electrocatalysts; the inset offis the N contents of the catalysts;gN 1sXPS spectra of the N-HOPG catalyst before and after ORR testing, ...
For more accurate information on the crystal structure, the binding energy and Raman shift of R-Si are measured by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The elemental components of R-Si are identified from the XPS survey spectrum (Fig. 4a). Peaks are observed at aroun...
The UPS (as well as XPS in Fig. 1) analysis suggests that the solution-based N-CD synthesis facilitated the heavy N-doping on the surface of graphene. The electronic energy level alignment diagrams of QD/N-CD/PVK and QD/PVK heterojunctions were then derived from the UPS analyses for the...
only need a low overpotential of 220 mV to reach a current density of 10 mA cm−2and displayed ultra-long lifetime than benchmark RuO2. From XPS and operando XAFS results, they demonstrated the valence state of Ru has no evident variation even after the stability test, preventing the ove...
near edge X-ray absorption fine structure (NEXAFS), Raman spectroscopy, nuclear diffraction, electron microscopy, Fourier transform infrared spectroscopy, ellipsometry, electron energy loss spectroscopy (EELS), reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS),...
c, d, High-resolution N 1s XPS spectra of C-DB-CDs (c) and HCP-C-DB-CDs (d). Source data Extended Data Fig. 7 Cross-sectional TEM image of LEDs and film properties of the active emission layer. a, Cross-sectional TEM image of the HCP-DB-CD-based LEDs. b, c, SEM image (...