必应词典为您提供built-inselftest的释义,网络释义: 内建自测;测试电路;
Built-in Self-Test (BIST)
Built-inSelfTest简称BIST是在设计时在电路中植入相关功能电路用于提供自我测试功能的技术,以此降低器件测试对自动测试设备(ATE)的依赖程度。BIST是一种DFT(DesignforTestability)技术,它可以应用于几乎所有电路,因此在半导体工业被广泛应用。举例来说,在DRAM中普遍使用的BIST技术包括在电路中植入测试图形发生电路,时序电路,...
Built-in self-testA method for testing a DAC including controlling the DAC digitally to cause it to produce a known desired analog output, for example a fixed amplitude sine wave; determining the duration of fixed voltage segments of the actual output of the DAC and using the duration of ...
7.1.2內建自我測試的結構(Built-in Self-Test Architecture) 除了在待測電路(CUT)外,基本的內建自我測試結構是由三個硬體模組組成。此結構如圖7.2所示。在此途中,測試試樣產生器對待測電路(CUT)產生測試試樣。而反應分析器同時壓縮且分析測試的反應來決定這待測電路的正確與否。內建自我測試控制器是控制整個內建自...
Built-in-self-testLeveraging BIST to reduce silicon cost in ISO26262 compliant semiconductors November 2, 2020 IC complexity for automotive applications continues to grow with experts estimating that automotive electronics will eventually exceed 50% of total… By Jake Wiltgen < 1 MIN READ...
1.17.4.3.2Built-in self-test In many cases stimulation of a microsystem by the property to be measured, such as pressure or acceleration, is not convenient due to practical reasons. Physical testing often becomes very demanding when it must be performed on the WL at high or low temperatures...
Built-in Self Test, orBIST, is the technique of designing additional hardware and software featuresintointegrated circuits to allow them to perform self-testing, i.e., testing of their own operation (functionally, parametrically, or both) using their own circuits, thereby reducing dependence on an...
Partial-scan built-in self-test technique Testing of an integrated circuit (10), configured of a plurality of flip-flops (14.sub.1 -14.sub.n), at least a portion of which are arranged in a scan chain (16.sub.1 -16.sub.k), is carried out by replacing each self-looping, non-scan...