Fig. 1. Fundamental principles of Atomic Force Microscopy (AFM) - based tissue mechanobiology. (A) Schematic describing the general AFM principles. An infrared laser is focused onto a soft microcantilever and its reflection is detected by a four quadrant photodetector. When the microcantilever is in...
Electrochemical Atomic Force Microscopy Study on the Dynamic Evolution of Lithium Depositionlithium metallithium dendritein situ EC-AFMlithium deposition schematicELECTROLYTENUCLEATIONANODEINTERFACECARBONATELithium metal is one of the most promising anode materials for lithium-ion batteries; however, ...
Atomic force microscopy (AFM)1 has the advantage of analysing unlabelled single molecules in physiological buffer and at ambient temperature and pressure, but its resolution limits the assessment of conformational details of biomolecules2. Here we present localization AFM (LAFM), a technique developed ...
0 50 100 150 Laser pulse energy (nJ per pulse) Focuser Z Cantilever c 1000 500 PVC Glass Second harmonic X Sample Y X–Y stage 0 0 50 100 150 Laser pulse energy (nJ per pulse) Figure 1 (a) Schematic of a super-resolution visible photoactivated atomic force microscopy (pAFM) system....
Atomic force microscopy Instrumentation A Nanoscope III or IIIa controller and a multimode atomic force microscope (Digital Instruments Inc., Santa Barbara, CA) equipped with a J-type scanner (maximum x-y scan range of ∼150 × 150 μm with 5 μm vertical range) was used for all experime...
The force-distance curve is a basic AFM operation to explain contact mode. A schematic of a force curve is depicted in figure 5. Figure 5. Force distance curve. The approach (red) and withdraw (blue) curves are shown on the right. Note that the total contact force is dependent on the...
Atomic force microscopy (AFM) is uniquely suited to characterize polymer materials on the nanoscale revealing structures and morphology without the need for extensive sample prep or vacuum environment. Unlike its electron microscopy counterparts, the interaction between probe and sample in AFM is mechanica...
Atomic force microscopy (AFM)-based scratching has achieved patterns with feature sizes at micro- and nanoscales [4, 5]. However, when the patterning reduces to the atomic or close-to-atomic scale, the experiment could be difficult to implement [6]. Thus, the experiments typically require an...
2.6 Surface Force Microscopy The invention of the atomic force microscope (AFM) has brought exciting capabilities for imaging solid–liquid interfaces and for measuring intermolecular forces. Fundamentally, an AFM records the deflection of a cantilever arm owing to secondary interactions between atoms on...
HS-AFM High-speed atomic force microscopy AFM Atomic force microscopy 1. Introduction Quantified measurements have long been possible using atomic force microscopy (AFM) but often lack the statistical power1 for any meaningful comparisons of samples or allow a demonstration of good repeatability. Improv...