Provides information on a low-cost model of an atomic force microscope to support teaching of modern physics in classrooms. Schematic diagram of the electronic circuit of the interface; Hard copy of the scanning result; Apparatus and procedure for setting up the model.Berger...
Atomic Force Microscopy (AFM) operated in the frequency modulation (FM) mode in ultra–high vacuum conditions (commonly known as Non–Contact AFM, NCAFM) has become an essential tool for nanoscience [1,2]. NCAFM allows us to explore and manipulate matter at the atomic scale through the inte...
Unlike expensive EM, the visible pAFM system can be simply implemented by adding an optical excitation sub-system to a commercial atomic force microscope. Light: Science & Applications (2017) 6, e17080; doi:10.1038/lsa.2017.80; published online 3 November 2017 Keywords: Arabidopsis imaging; gold...
created an experimental setup consisting of a microfluidic chamber mounted on a combined AFM and confocal microscope (AFM-CLSM) to study mouse submandibular salivary gland sections with force-spectroscopy [93]. This setup allowed for a constant media flow to study real-time mechanical changes in ...
DIY AFM (Atomic Force Microscope) / 自己動手做原子力顯微鏡: I am pleased to share with you that the DIY AFM is reported by the latest Nature Nanotechnology 10, 480 (2015) that the DIY AFM is assembled by junior high school student and successfully measu
During the process, the deflection of the cantilever and the movement of the piezo tube are recorded to produce so-called force curves. Figure 1B shows a schematic diagram of a force curve obtained during the approach-retract cycles. A force curve contains two com- ponents: an approach ...
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The atomic force microscope (AFM) is a form of scanning probe microscopy that achieves sub-nanometer imaging resolution, far exceeding the optical diffraction limit, by mechanically feeling the surface of a sample with a highly sensitive probe. ...
(b) Block diagram for the feedback loop. (c, d) Overall view of a high-speed AFM head unit mounted on a standard inverted optical microscope (OLYMPUS IX71, Olympus, Tokyo, Japan). (e) Bottom view of the head unit. SCIENTIFIC REPORTS | 3 : 2131 | DOI: 10.1038/srep02131 3 www....
2.1.4 Atomic force microscope nanomachining Atomic force microscopy was employed as a single-atom layer removal method for single-crystalline Si. Unlike the conventional uses of AFM probes based on mechanical abrasion, fracture, and deformation, Chen et al [47] developed a new way of using the...