Amorphous Silicon Nitride Anodes for Li-Ion BatteriesAsbjørn UlvestadJan Petter MaehlenHanne Flåten AndersenOystein PrytzTrygve Tveiterås MongstadMartin Kirkengen
中文名称:Silicon(IV) nitride, amorphous, 96+% 中文同义词: 英文名称:Silicon(IV) nitride, amorphous, 96+% 英文同义词:2,4,6,7-Tetraaza-1,3,5-trisilahexacyclo[3.1.1.01,4.02,5.03,6.03,7]heptane CAS号:919706-20-0 分子式:N4Si3 分子量:140.28 ...
Amorphous silicon nitride films have been deposited in a gas flow system by the ammonolysis of silicon tetrachloride and the nitridation of silane with ammonia on heated substrate surfaces. The dependence of the deposition rate on the substrate temperature and the reactant composition and flow rate ...
We developed an empirical potential for interactions between Si and N to describe silicon nitride systems using the Tersoff functional form. The fitting parameters were found using a set of ab initio and experimental results of the crystalline phase. Using this empirical model, we explored the struc...
A Silicon-29 MAS–NMR Study of ?-SiliconNitride and Amorphous Silicon OxynitrideFibresG. Chollon,* R. Hany, U. Vogt and K. BerrothSwiss Federal Laboratories for Materials Testing and Research (EMPA), Ueberlandstrasse 129, CH-8600 Duebendorf,Switzerland(Received 17 March 1997; accepted 11 ...
Firstly,cluster models of defects in amorphous silicon nitride with and without doping special element,such as oxygen,sulfur,phosphorus,fluorine or chlorine,are built. 建立无定形氮化硅和氧、硫、磷、氟或氯掺杂氮化硅中缺陷的簇模型;根据第一性原理的密度泛函理论(DFT),对缺陷的簇模型结构优化并计算能量...
We studied a new method of Ni-induced crystallization of amorphous silicon (a-Si) through a silicon-nitride (SiNx) cap layer. A 0.5 nm of Ni layer was deposited on the SiNx/a-Si layers and then this was annealed in a rapid thermal annealing system. The Ni diffused through the cap laye...
2) amorphous silicon nitride 无定形氮化硅 1. Firstly,cluster models of defects inamorphous silicon nitridewith and without doping special element,such as oxygen,sulfur,phosphorus,fluorine or chlorine,are built. 建立无定形氮化硅和氧、硫、磷、氟或氯掺杂氮化硅中缺陷的簇模型;根据第一性原理的密度泛函...
Structure and elastic properties of amorphous silicon carbon nitride films - art. no. 165305 Structure and elastic properties of amorphous silicon car- bon nitride films. Phys. Rev. B 64 (16), 165305.G. Lehmann et al., "Structure and elastic properties of amorphous silicon carbon nitride ...
Using Si 2p core-level X-ray photoelectron spectroscopy, we found that the short-range order in amorphous silicon oxynitride (a-SiOxNy) can be quantitatively described by a random bonding model. Results also show that the second and even further neighbours of the Si in the network affect the...