AEC - Q003 Rev - 集成电路产品电气性能鉴定指南Guidelines for Characterizing the Electrical Performance of Integrate.pdf,AEC - Q003 July 31, 2001 ) Process q s Window / s Matrix Cell m h o ( s R e s a B Beta Lower Upper Spec Spec y c n e u q e r F Device P
搜试试 5 悬赏文档 全部 DOC PPT TXT PDF XLS 广告 百度文库 专业资料 工程科技 电子/电路AEC_Q003A_电子/电路_工程科技_专业资料 暂无评价|0人阅读|0次下载 | 举报文档 AEC_Q003A_电子/电路_工程科技_专业资料。AEC-Q003 Automotive Electronics Council Component Technical Committee AEC - Q003 Rev-...
AEC_Q003 AEC - Q003 July 31, 2001 Component Technical Committee Automotive Electronics Council
AEC - Q003 July 31, 2001 Base Rs (ohms /sq) Process Window Matrix Cell Beta Lower Spec Frequency Upper Spec Device Parameter (at one test temperature) 2 GUIDELINE FOR CHARACTERIZATION OF INTEGRATED CIRCUITS Each dot is a measurement from one part Test Limit P a r a 2 e t e r ...