GUIDELINE FOR CHARACTERIZATION OF INTEGRATED CIRCUITS AEC - Q003 July 31, 2001Component Technical CommitteeAutomotive Electronics CouncilUpper SpecLower SpecProcessWindow Device Parameter (at one test temperature)FrequencyBetaBase Rs (ohms /sq)Matrix CellTest LimitEach dot is ameasurementfrom one partGuar...
AEC-Q103-002 微机电系统压力传感器器件应力测试 AEC-Q103-003 MEMS麦克风器件应力测试 AEC-Q104 车用多芯片模块可靠性测试 AEC-Q200 被动组件应力测试（Stress Test））的认证规范（无源器件）AEC-Q200-001 阻燃性能测试 AEC-Q200-002 人体模式静电放电测试 AEC-Q200-003 断裂强度测试 AEC-Q200-004 自恢复保险...
AEC-Q102 车用分立光电半导体元器件可靠性验证测试 AEC-Q102-001 露水测试 AEC-Q102-002 电路板柔性测试 AEC-Q102-003 光电多芯片模块 (OE-MCM) AEC-Q103 汽车传感器应力测试的认证规范 AEC-Q103-002 微机电系统压力传感器器件应力测试 AEC-Q103-003 MEMS麦克风器件应力测试 AEC-Q104 车用多芯片模块可靠性...
AEC_Q003 AEC - Q003 July 31, 2001 Component Technical Committee Automotive Electronics Council
sample size要考虑到confidence interval:置信区间和confidence level:置信水平,这两个是统计用语,sample size的确认要考虑到这两个参数的要求吗? 4.3 Characterization Report The characterization report should include the following: 特征参数报告应该包括:
Automotive Electronics Council Component Technical Committee AEC - Q003 Rev-A February 18, 2013 GUIDELINE FOR CHARACTERIZATION OF INTEGRATED CIRCUITS Automotive Electronics Council Component Technical Committee AEC - Q003 Rev-A February 18, 2013 Acknowledgment Any document involving a complex technology ...
AEC-Q103-003 MEMS麦克风器件应力测试 AEC-Q104 车用多芯片模块可靠性测试 AEC-Q200 被动组件应力测试(Stress Test))的认证规范(无源器件) AEC-Q200-001 阻燃性能测试 AEC-Q200-002 人体模式静电放电测试 AEC-Q200-003 断裂强度测试 AEC-Q200-004 自恢复保险丝测量程序 ...
AEC-Q102 车用分立光电半导体元器件可靠性验证测试 AEC-Q102-001 露水测试 AEC-Q102-002 电路板柔性测试 AEC-Q102-003 光电多芯片模块 (OE-MCM) AEC-Q103 汽车传感器应力测试的认证规范 AEC-Q103-002 微机电系统压力传感器器件应力测试 AEC-Q103-003 MEMS麦克风器件应力测试 AEC-Q104 车用多芯片模块可靠性...
AEC - Q003 July 31, 2001 Base Rs (ohms /sq) Process Window Matrix Cell Beta Lower Spec Frequency Upper Spec Device Parameter (at one test temperature) 2 GUIDELINE FOR CHARACTERIZATION OF INTEGRATED CIRCUITS Each dot is a measurement from one part Test Limit P a r a 2 e t e r ...
AEC–Q003 July31,2001 ComponentTechnicalCommittee AutomotiveElectronicsCouncil 1of11 Guideline For TheCharacterizationofIntegratedCircuits 1.PURPOSE: ThecharacterizationofICsisanextremelyimportantfunctionduringthedevelopmentofanew ICorthemodificationofanexistingIC.Thepurposeofthisdocumentistoprovideguidanceby ...