X-ray diffractionPolar transformationEvolutionary eigenstrain modelDeformation analysis in engineering materials and components is a subject of ongoing enquiry due to its importance for obtaining reliable prediction of strength and durability of structures and assemblies. Whilst optical methods deliver ...
As shown in Fig.2a, the powder X-ray diffraction (PXRD) patterns of JNM-7-AA feature an intense peak at a low angle of 2.56° attributed to (100) reflection facet along with the minor peaks at 4.52° and 6.92° for (110) and (120) diffractions, respectively. To elucidate the crysta...
3D, solid-state, 2D, X-ray diffraction Description The first detector to bring 0D-1D-2D and 3D data to your diffractometer The PIXcel3D is a unique 2D solid-state hybrid pixel detector. Each pixel is 55 microns x 55 microns and the detector array is 255 x 255 pixels. The detector, ...
A GUI program for fast analysis of powder X-ray diffraction Images. It provides the capability of calibrating, creating masks, having pattern overlays and showing phase lines. Maintainer Clemens Prescher (clemens.prescher@gmail.com) Requirements ...
ayou looks so kind and beatiful 您看很亲切和美丽[translate] a(MarResearchi Co. Ltd., Germany) at the National Synchrotron 它被看见了CNT|个人计算机大师[translate] atwo-dimensional wide angle X-ray diffraction (2D-WAXD) 它被看见了CNT|个人计算机大师[translate]...
the atomic ratios of Te/Mo are evaluated to be∼1.92 and ~1.98 for the 1Tʹ- and 2H-MoTe2layers, respectively, confirming the existence of more Te deficiency in the 1Tʹ-MoTe2layer. As shown in Fig.S3, the X-ray diffraction (XRD) patterns of both the 1Tʹ- and 2H-MoTe2laye...
Synthesis, 2D NMR and X-ray diffraction studies on Cu(II) and Ni(II) complexes with ligands derived from azobenzene-cored Schiff base: Mesomorphic behaviors of Cu(II)-phenolates and crystal structure of bis[4-(4-alkoxy-2-hydroxybenzylideneamino)azobenzene]copper(II).J Mol Struct. 2011;999:...
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The X-ray diffraction pattern of the ablated surface of the C/SiC is shown in Figure 7. From this, it can be observed that the surface of the C/SiC after ablation consisted of C and SiC, and there is no diffraction peak indicating the presence of a SiO2 material phase. The primary ...
A GUI program for fast analysis of powder X-ray diffraction Images. It provides the capability of calibrating, creating masks, having pattern overlays and showing phase lines. Maintainer Clemens Prescher (clemens.prescher@gmail.com) Requirements ...