X-ray photoelectron spectroscopy (XPS) uses x rays of a characteristic energy (wavelength) to excite electrons from orbitals in atoms. The photoelectrons emitted from the material are collected as a function of their kinetic energy, and the number of photoelectrons collected in a defined time int...
High-energy and conventional x-ray photoelectron spectroscopy (XPS) using Cr K β ( h ν = 5946.7 eV) and Al K α ( h ν = 1486.6 eV) radiation, respectively, were employed to study the alloying behaviour of Ti with Al and V in Ti–Al (Al = 10, 20 and 30 at.%), V–50at....
X‐ray photoelectron spectroscopy and optoelectrical properties of low‐concentration erbium‐doped GaSb layers grown from Sb‐rich solutions by liquid‐phase ... Y Sun,M Wu - 《Journal of Applied Physics》 被引量: 20发表: 1995年 Trap Levels in Eu‐Doped SrAl2O4 Phosphor Crystals Co‐Doped ...
A direct observation of interfacial defects caused by electron beam irradiation in a scanning electron microscope of device‐quality Si‐SiO2structures has been made by x‐ray photoelectron spectroscopy (XPS). Radiation‐hard oxides (700 thick) on Si were subjected to 20‐keV electron bombardment and...
X‐ray Photoelectron Spectroscopy Investigations of the Interaction of Cells with Pathogenic Asbestoses. Journ. of Vac. Sci. and Tech. A. 1996, 14, ... C Wang,W Ming,S Fu 被引量: 0发表: 1995年 Mapping the Collagen-binding Site in the von Willebrand Factor-A3 Domain It has been recogn...
Synchrotron-based X-ray photoemission electron microscopy (X-PEEM), atomic force microscopy (AFM), time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) have been used to visualize and characterize plasma polymerized acrylic acid (ppAA) and poly ethyle...
The binding energy of Si 2 p electrons and the kinetic energy of the Si(KLL) X-ray-excited state were measured by using X-ray photoelectron spectroscopy (XPS) and X-ray Auger electron spectroscopy (XAES), respectively, for silicates with SiO 4 tetrahedra of various polymerization types. The...
(Pb_(1-x)Cd_x)S Nanoparticles Embedded in a Conjugated Organic Matrix, as Studied by Photoluminescence and Light-Induced X-ray Photoelectron Spectroscopy B;Ronit;C;Hagai;M;Edith;et;al.(Pb1 -xCd x)S Nanoparticles Embedded in a Conjugated Organic Matrix,as Studied by Photoluminescence and ...
Thickness determination of uniform overlayers on rough substrates: A comparison of calculations for Al2O3/Al to x‐ray photoelectron spectroscopy and atomi... Thickness determination of uniform overlayers on rough substrates: A comparison of calculations for Al2O3/Al to x‐ray photoelectron spectrosco...
A simple approach to estimating the detection limits of X-ray photoelectron spectroscopy (XPS) for any element in any elemental matrix is presented, using the intensity of the background at the expected position for the photoelectron peak to be detected. The approach has been extended to estimate...