1 XRD pattern s of Fe2 O3 K2 O 减弱 ,多铁酸钾的衍射明显增强 . 这表明该样品中虽仍 sa mples calc ined at dif f erent α te mperat ures 有 Fe O ,但多铁酸钾 已成为主要物相 . 值得指出的 2 3 A) 500 ℃,B) 700 ℃,C) 750 ℃, 是 , 虽然 图 1F 中可被指认为多铁酸钾之各衍射...
XRD衍射图分析,荣涛2014年4月25日,(d)XRDpatternoftheFe3O4nanoflakes.,Fig.1ddepictstheXRDpatternoftheFe3O4nanoflakes.ThepositionandrelativeintensityofallthediffractionpeaksmatchwellwiththestandardXRDpatternofFe3O4(JCPDSNo.88-0866).BasedontheScherrerformula,theaveragecrystallitesizeofFe3O4iscalculatedtobeca...
and relative intensity of all the diffraction peaks match well with the standard XRD pattern of Fe3O4 (JCPDS No. 88-0866). Based on the Scherrer’ formula, the average crystallite size of Fe3O4 is calculated to be ca. nm by using the FWHM intensity of the (311) peak of Fe3O4. ...
XRD 图图 图 衍射 分析 图涛 2014 年4 月25 日 (d) XRD pattern of the Fe3 O4 nanoflakes. Fig. 1d depicts the XRD pattern of the Fe3O4 nanoflakes. The position and relative intensity of all the diffraction peaks match well with the stan dard XRD pattern of Fe3O4 (JCPDS No. 88-086...
XRD衍射图谱分析 荣涛2014年4月25日 Fig.1ddepictstheXRDpatternoftheFe3O4nanoflakes.ThepositionandrelativeintensityofallthediffractionpeaksmatchwellwiththestandardXRDpatternofFe3O4(JCPDSNo.88-0866).BasedontheScherrer’formula,theaveragecrystallitesizeofFe3O4iscalculatedtobeca.15.4nmbyusingtheFWHM...
Graph represents the XRD pattern of synthesized MNPs shows the formation of Fe3O4 based on the comparison of their XRD patterns with the standard pattern of Fe3O4 (04-013-9808).Heba, BassionySalwa, Sabet...
XRDXRD衍射图分析衍射图分析荣涛2014年4月25日集成电路是采用半导体制作工艺,在一块较小的单晶硅片上制作上许多晶体管及电阻器、电容器等元器件,按照多层布线或遂道布线的方法将元器件组合成完整的电子电路,因其管脚非常密集,所以非常容易造成虚焊.脱焊等原因故障率较高。(d)XRDpatternoftheFe3O4(d)XRDpatternof...
1d depicts the XRD pattern of the Fe3O4 nanoflakes. The position and relati; XRD图谱实例分析: X射线多晶衍射分析实例 单物相成分定性分析 一、打开XRD图普文件 二、对图谱进行处理 对XRD图谱进行K α2去除和图谱的平滑处理 三、对图谱进行寻峰 根据图谱的实际情况设置寻峰条件,对图谱进行寻峰; ...
Fe 3 O 4 and a suite of ZnAl 2 O 4 samples annealed at 900 to 1400° C and then rapidly quenched, have been determined by powder X-ray diffraction, using several different X-ray procedures and both conventional structure-factor refinement and whole-pattern (or Rietveld) refinement methods...