Internal stress in MPCVD diamond films on the Si substrate based on XRD line shapeX射线衍射测量,金刚石薄膜,化学汽相沉积,微波等离子体化学气相沉积法,硅衬底,内应力,宏观应力,线形到Si 底层的钻石电影支持者从 6 h 在 6000 W 和 4000 W 的微波力量与微波血浆 CVD (MPCVD ) 被扔到 10 h 分别地,...
Alves,et al.XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates. Materials ... N Franco,NP Barradas,E Alves,... 被引量: 0发表: 2005年 Influence of substrate misorientation on defect and impurity incorporation in GaAs...
Sample for analysis: Al2O3/Si See figure below for results of fitting the XRR pattern of aluminum oxide films on silicon substrate. The table below suggests there are two layers of aluminum oxide films at different densities (the thickness is 0.94 nm and 6.69 nm for upper and lower layer ...
The integral strength of 256 cm-1vibration mode increases first and then decreases with the in⁃crease of film thickness,and the Raman integral strength corresponding to 2 300 nm-Mg sample is thestrongest.Key words:Mg 2 Si;thin film;Si substrate;X⁃ray diffraction(XRD);scanning electron ...
XRD技术及其在催化中的应用分析 XRD技术及其在催化中的应用 晶体的对称性 固态物质按其原子（或分子、离子）在空间排列是否长程有序分成晶态和无定形两类。所谓长程有序是指固态物质的原子（或分子、离子）在空间按一定方式周期性的重复排列。整个晶体是由晶胞按周期性在三维空间重复排列而成。理想的晶体结构可以用...
Qualitatively, the titanium film has a texture in which the [0001] direction is normal the silicon substrate surface, while the TiN and aluminium films both have a texture with a [111] direction normal to this surface. XRD pattern of Al/Ti/TiN multilayers deposited on (100)Si ...
20304050607080edcb C (311) C (220) C (200)2 ,degree C (111)TTTTTRRAAA : anataseR : rutileT : Ti substrateC : Cu2OIntensity (a.u.)Aa 对某一晶体,现假设一可能的结构,并推算对某一晶体,现假设一可能的结构,并推算出不同衍射指标出不同衍射指标(hkl)(hkl)所代表的各衍射方向的所代表的各...
Dahlem1 The incorporation of noble metal nanoparticles, displaying localized surface plasmon resonance, in the active area of donor-acceptor bulk-heterojunction organic photovoltaic devices is an industrially compatible light trapping strategy, able to guarantee better absorption of the incident photons ...
onstant d along the(111) orientation reduced about0 35%compared with the Ag films deposited on SiO2substra te at the sa me conditions. The re sult indicated that the Ag XRD spectra of the three layer metal(alloy)films can move back to the same position with Ag film on SiO2substrate ...
Februar 2021,10,Grazing incidence diffractionAg2Te thin film on glass,Bragg-Brentano geometry,Grazing incidence geometry,GIXRD emphasizes the signal of the Ag2Te nanocrystallites and the glass substrate signal is reduced,01/02/2021,Bruker Confidential,11,对称扫描和掠入射扫描的对 12、比,1. Febru...