必应词典为您提供X-RAY-PHOTOELECTRON-SPECTROMETRY的释义,网络释义: 射线光电子能谱测量法;X射线光电子谱法;
X-ray Photoelectron Spectrometry (XPS) helps scientists understand the surface chemistry of materials, and it can used to explore nearly every element, with the exception of hydrogen and helium. By clicking on different elements on theXPS periodic tableon ourXPS Simplifiedwebpage, researchers can ob...
We report on the use of medium- and high-resolution time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy in an investigation of the changes that occur as a result of exposure to UV light from a 'black lamp' source. The experiment mimics closely the effects of ...
Howell, D., Mitchell, R., Carr, C. M. and Walton, J. (1999) X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Study of the Tarnishing of Metal- Coated Textiles, Journal of the Textile Institute 90, 3, 50-59....
1、第五章 X-射线光电子能谱(X-ray Photoelectron Spectroscopy (XPS) ESCA),一 概述,表面分析技术 (Surface Analysis)是对材料外层(the Outer-Most Layers of Materials (100 )的研究的技术。包括: 1 电子谱学(Electron Spectroscopies) X-射线光电子能谱 XPS: X-ray Photoelectron Spectroscopy 俄歇能谱 AES...
光：IncidentX-ray发射出的光电子EjectedPhotoelectron FreeElectronLevelFermiLevel ConductionBand ValenceBand2p2s1sL2,L3L1K 1电磁波使内层电子激发，并逸出表面成为光电子，测量被激发的电子能量就得到XPS，不同元素种类、不同元素价态、不同电子层(1s,2s,2p等)所产生的XPS不同。2被激发的电子能量可用下式表示：...
& Ebel, H. About the charging effect in X-ray photoelectron spectrometry. J. Electron Spectrosc. Relat. Phenom. 3, 169–180 (1974). Article CAS Google Scholar Landis, W. J. & Martin, J. R. X‐ray photoelectron spectroscopy applied to gold‐decorated mineral standards of biological ...
包括: 1 电子谱学(Electron Spectroscopies) X-射线光电子能谱 XPS: X-ray Photoelectron Spectroscopy 俄歇能谱 AES: Auger Electron Spectroscopy 电子能量损失谱 EELS: Electron Energy Loss Spectroscopy 2 离子谱学 Ion Spectroscopies 二次离子质谱SIMS: Secondary Ion Mass Spectrometry 溅射中性质谱SNMS: Sputtered...
X-ray photoelectron spectrometry depth profiling of organic thin films using C-60 sputtering A buckminsterfullerene (C(60)) ion beam was used for X-ray photoelectron spectrometry depth profiling of various organic thin films. Specimens representing... YY Chen,BY Yu,WB Wang,... - 《Analytical ...
Among the many surface-analytical techniques, X-ray photoelectron spectroscopy (XPS) is commonly used in a variety of fields, including earth and environmental sciences, due to its versatility. This chapter demonstrates some examples of important items of information (surface chemical composition and ...