输入波长即可；如Cu靶：1.54056；同步辐射选取X-Ray，输入线站波长，比如：0.6887；...
Fig. 1. Procedure of X-ray CT scan. Show moreView article X-Ray Analysis Ron Jenkins, in Encyclopedia of Physical Science and Technology (Third Edition), 2003 I Use of X Rays for Materials Characterization X rays are a short-wavelength form of electromagnetic radiation discovered by Wilhelm ...
X-ray-photoelectron and x-ray-photoabsorption study of pressure-amorphized T-${\\mathrm{Nb}}_{2}$${\\mathrm{O}}_{5}$... JS Tse,DD Klug,ZH Lu 被引量: 1发表: 1994年 Intensity and wavelength dependence of the photoconductivity in Cr-doped Sr(mathsf{_{0.61}})Ba(mathsf{_{0.39}}...
The principle of wide-angleX-ray diffractioncan be exemplified by considering a beam of X-rays with a wavelengthλimpinging at an angleθon a diffracting material with a set of crystal planes of spacingd, seefigure 2.58. Sign in to download full-size image ...
aX-ray diffraction (XRD, Bede D1) and HRTEM (JEOLJEM2010) were used toevaluate the crystallization, microstructure, and interface properties. PL (HORIBA LabRAMHR800) measurements were conducted at room temperatureto analyze the optical properties of the ZnO films in a wavelength range of350–...
快速退火對樣品之影響—以X-ray繞射(XRD)與反射(XRR)分析CoFeB/MgO/CoFeB結構及介面特性 指導教授黃榮俊教授報告人物理五陳俊頴C34931120 June32009inNCKU 使用XRD分析晶相、晶格常數使用X-rayreflectivity(XRR)分析介面粗糙度、膜厚使用TEM觀察紋理及、粗糙度退火溫度:無、300˚C、400˚C、475˚C、500˚C、...
Since the discovery of X-rays over a century ago the techniques applied to the engineering of X-ray sources have remained relatively unchanged. From the inception of thermionic electron sources, which, due to simplicity of fabrication, remain central to
X-ray-diffraction studies on liquid acetonitrile at 20掳C were carried out at a wavelength of 0路7 . The data were corrected for polarization, absorption, Compton scattering and multiple scattering. The coherent distinct differential cro... H Bertagnolli,Zeidler, M.D. - 《Molecular Physics》 ...
Diffraction occurs at an angle 2θ, defined by Bragg's Law: nλ = 2d sin θ, where n is an integer denoting the order of diffraction, λ is the x-ray wavelength, d is the lattice spacing of crystal planes, and θ is the diffraction angle. For the monochromatic x-rays produced by ...
of the diffracted X-ray beam depends on the spacing, d, between planes of atoms in a crystalline phase and on the X-ray wavelength, λ. in accordance with the Wulf-Bragg equation: 2dsinθ=nλ The intensity of the diffracted beam depends on the arrangement of the atoms on these planes....