X光电子能谱(X-ray photoelectron spectroscopy(XPS))是一种表面灵敏的定量分析手段,尽管理论上说是能定量分析,但是其作为定性分析的功能其实更加出众,因为得到XPS能谱后还要对数据进行拟合,而数据和拟合的好坏会导致得到的分析结果差很多,所以XPS一般还需要别的仪器辅助表征。XPS能够快速分析出样品中的元素类型,但是元...
PURPOSE:To track with a high time resolution a transient change of a composition or a chemical coupling state of a substance with a simple X-ray photoelectron spectroscope using a commercially available X-ray tube. CONSTITUTION:The apparatus is based on a photoelectron spectroscope using a soft X...
X射线光电子能谱(X2ray photoelectron spectroscopy, XPS)是分析物质表面化学性质的一项技术。XPS可测量材料中元素组成、经验公式、元素化学态和电子态。当 X射线与样品相互作用 后,激发出某个能级上的电子,测量这一电子的动能,可以得到样品中有关的电子结构信息,这就是 XPS方法的最简单描述。 详细来说,XPS就是用...
1、X射线光电子谱射线光电子谱(XPS)X-ray Photoelectron SpectroscopyXPS 引言引言X射线光电子谱是重要的射线光电子谱是重要的表面分析技术表面分析技术之一。它不仅能探之一。它不仅能探测表面的化学组成,而且可以确定各元素的测表面的化学组成,而且可以确定各元素的化学状态化学状态(元(元素所处的化学环境)。素所处...
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a highly surface-sensitive, quantitative, chemical analysis technique that can be used to solve a wide range of materials problems. XPS is the measurement of photoelectrons ejected from the...
X-ray photoelectron spectroscopy depth profiling with ion beam etching. Contact usJoin the conversation XPS depth profiling Experimental arrangement for a depth-profile experiment. Monatomic depth profiling uses an ion beam to etch layers of the surface or surface contamination, revealing...
X-ray photoelectron spectroscopy enables XPS surface analysis, providing elemental composition and the chemical/electronic state of the top 10 nm of a material.
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光:IncidentX-ray发射出的光电子EjectedPhotoelectron FreeElectronLevelFermiLevel ConductionBand ValenceBand2p2s1sL2,L3L1K 1电磁波使内层电子激发,并逸出表面成为光电子,测量被激发的电子能量就得到XPS,不同元素种类、不同元素价态、不同电子层(1s,2s,2p等)所产生的XPS不同。2被激发的电子能量可用下式表示:...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...