This paper presents some applications of X-ray diffraction analysis for the development and quality control of modern semiconductor detectors.doi:10.1016/S0168-9002(03)01640-1Vladimir KoganPANALYTICALKlaus BethkeRoelof de VriesElsevier B.V.Nuclear Instruments & Methods in Physics Research...
Soon after it was also established that secondary fluorescent x-rays were excited in any material irradiated with beams of primary x-rays. This started investigation into the possibilities of fluorescent x-ray spectroscopy as a means of qualitative and quantitative elemental analysis...
Our solutions cover bulk material and surface sensitive X-Ray Diffraction (XRD), biological and chemical crystallography, wavelength and energy dispersive X-Ray Fluorescence (XRF) analysis, 3D X-Ray Microscopy (XRM), Optical Emission Spectroscopy (OES),
(1986), X-ray fluorescence in the SEM – advantages in material analysis. Scanning, 8: 232–238. doi: 10.1002/sca.4950080506 Author Information Research Center Standard Elektrik Lorenz AG, Holderäcker-Strasse 35, D-7000 Stuttgart, FRG Publication History Issue published online: 9 AUG 2011 ...
X-Ray analysis of crystals of 2-methyl-5-phenyltriazolo[4,5-d]triazole 38, obtained by diffusion from methane/ethanol (P1¯ space group), indicates there are two molecules per asymmetric unit. The first is essentially planar, with a mean deviation (non-H-atoms) of 0.03 Å and a maxi...
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in...
Crystallography Analysis Nano-Technology Research and X-Ray Analysis GLP and cGMP Pharmaceutical X-Ray Powder Diffraction Services Nano-Materials Analysis and Research Materials Analysis and Testing Intertek provides analytical and physical analysis for a wide range of materials with a global network of la...
Small angle X-ray scattering(SAXS) is an effective method in the analysis of materials microstructure.The theory of small angle X-ray scattering was introduced and its applications in the study of material science were reviewed such as the measurement of nanoparticle size,vacancy density and precipi...
X-ray fan beam coded aperture transmission and diffraction imaging for fast material analysis Article Open access 19 May 2021 Introduction Literature overview X-ray computed tomography (CT) is based on the measurement of X-ray transmission across a large region of interest (ROI), for example a...
High-Z Materials for X-Ray Detection: Material Properties and Characterization Techniques (Springer Nature, 2023). This book covers a wide range of topics, including in-depth analysis of the development and utilization of high-Z materials, as well as their applications in X-ray detection. ...