材料的性能与其成分和结构紧密相关。在对材料进行表征时,我们可以通过形貌观察获得材料的结构信息、通过元素分析获得材料的成分信息。X射线能谱仪(Energy Dispersive X-ray Spectroscopy,EDS)简称能谱仪,是扫描电镜进行元素分析的重要附件。它通过判别特征X射线的能量对材料的成分进行定性和定量分析,面分布技术还可以提供元...
PURPOSE: An X-ray electronic spectrum analyzer is provided to make various experiments at any time and any places by mounting a plurality of units having different functions in one system and to secure reliable experimental results without an EXAFS(Extended X-ray Absorption Fine Structure) equipment...
SCANNING ELECTRON MICROSCOPY X-RAY ENERGY SPECTRUM ANALYSIS OF THE UNICELLULAR ALGAE ABSORBED THE Cu~(2+) Zn~(2+) Se~(4+) Cd~(2+) .SCANNING ELECTRON MICROSCOPY X-RAY ENERGY SPECTRUM ANALYSIS OF THE UNICELLULAR ALGAE ABSORBED THE Cu~(2+) Zn~(2+) Se~(4+) Cd~(2+).[J];MARINE .....
— Use basic parameter method analysis plus experience to calibrate b) The analysis method calibration takes into account the interference of the spectrum, matrix effects and other effects, which will affect the intensity of fluorescence scattering in the spectrum Degree of determination. A list of t...
x射线光电子能谱分析.pdf,X-射线光 能谱 (XPS) X-ray Photoelectron Spectroscopy X射线与物质相互作用 光电效应 俄歇效应 简要历史 一次大战前已有几个研究小组分析了硬X射线轰击 所发射的 能量。 1914年, erford 地表述了XPS基本方程: E = hν - E - φ。 k
The L spectra of the metal and K// alpha bands of the metalloid in metal-like carbonitrides and carboxides of titanium have been studied using X-ray electronic spectroscopy. It has been found that the 2p bands of the metalloid are filled and lie below the Fermi level, at 4, 6, and ...
X射线光电子能谱(X2ray photoelectron spectroscopy, XPS)是分析物质表面化学性质的一项技术。XPS可测量材料中元素组成、经验公式、元素化学态和电子态。当 X射线与样品相互作用 后,激发出某个能级上的电子,测量这一电子的动能,可以得到样品中有关的电子结构信息,这就是 XPS方法的最简单描述。
XPS X-Ray Sources In XPS instruments, X-rays are generated by bombarding a metallic anode with high-energy electrons. The energy of the emitted X-rays depends on the anode material, and the beam intensity depends on the electron current striking the anode and its energy. ...
表面分析技术(SurfaceAnalysis)是对材料外层(theOuter-MostLayersofMaterials(<100))的研究的技术。包括：1电子谱学(ElectronSpectroscopies)X-射线光电子能谱XPS:X-rayPhotoelectronSpectroscopy俄歇能谱AES:AugerElectronSpectroscopy电子能量损失谱EELS:ElectronEnergyLossSpectroscopy 2离子谱学IonSpectroscopies ...
29、 the lower spectrum arises because typical x-ray sources also emit some x-rays of a slightly higher photon energy than the main Mg Ka line; this satellite peak is a ghost of the main 2p3/2 peak arising from ionization by these additional x-rays. 32 Angle-Dependent Analysis of a Si...