X-ray diffraction method 英[ˈeksrei diˈfrækʃən ˈmeθəd] 美[ˈɛksˌre dɪˈfrækʃən ˈmɛθəd] 释义 [医]X射线衍射法 实用场景例句 全部 The crystal structure of CSSB was determined by X - ray diffraction method. 用X 射线衍射方法测定了CSSB的...
PURPOSE:To make it possible to measure only monochroic X-rays to be detected with high accuracy by removing a higher harmonic component, by reflecting white X-rays generated from an X-ray source by a spectral crystal and allowing the relfected X-rays to further transmit through a second ...
X-Ray Diffraction Besides the use of X-ray absorption for the elucidation of adsorbates and adsorbate-surface interaction X-ray diffraction is a tool useful in particular for the determination of structural data on a very high level of precision provided the presence of a minimum level of ...
x-ray diffraction实验1 X－rayDiffraction－ 化学与化学工程学院无机材料实验室 概述 1895年，W.C.Roentgen在研究阴极射线管时发现X射线。－－－X射线透视技术。19121912年，M.VonLaue以晶体为光栅，发现M.Von了X射线的衍射现象，确定了X射线的电磁波XX性质。X射线是种电磁辐射，波长比可见光短，介于紫外与γ射线...
3.2 The X-ray diffraction method X-ray diffraction is a method that can be used with materials having a crystalline structure (Lu and Retraint, 1998). Residual stresses in crystalline materials can be measured to a maximum depth of about 0.05 mm. Layer removal such as etching is required fo...
X-ray diffraction methods: polycrystallineaberrationsaccuracyanalytical extrapolation of latticeangle‐dispersive diffractometryBragg anglecamera methodsdetectiondiffractometryerrorsgeometrical aberrationsThe determination of lattice parameters using X-ray powder methods is reviewed. Topics covered include: wavelength ...
An X-ray diffraction method of testing the crystal, the crystal includes a single crystal substrate, grown on a single crystal substrate lattice mismatch at least one material. 所述方法先扫描出样品的倒易空间图,根据倒易空间图,计算出ω轴与2θ轴之间的运动速度比1:n;然后对测试样品采用ω轴与2θ...
产生机理:阴极(e.g., 钨灯丝)通电加热释放热辐射自由电子,高压使其高速定向运动,轰击阳极(靶材Target)使其突然减速或停止,在此过程中运动电子只有1%的动能转变为X射线,其余动能转化为热量。在临界管电压作用下,高速阴极电子可将原子的内层电子轰击到能量较高的外层或脱离原子,从而得到原子激发状态或引起原子电离。处...
An X-ray diffraction stress determination method, the first set of X-ray optical system φ = 0 ° position. 从X射线源(12)向试样(10)入射的X射线(14)在米勒指数(hkl)的晶面(其法线方向为角度ψ的方向)上衍射,其衍射X射线(16)被X射线检测器(18)检测,决定米勒指数,能够决定无应变状态下的布拉格角(...
[5] Schwarz R R , Mccallum D . Analysis of Ferrosilicon and Silicon Carbide by an X-ray Fluorescence Fusion Method—An X-ray Diffraction Investigation of the Preliminary Oxidation[J]. Analytical Communications, 1997, 34(6):165-169.