X射线能谱仪 1. APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS; 扫描电镜及X射线能谱仪在首饰镀层检测中的应用 2. From the analysis of the EDS, we found that the ratio of the two elements approached 1:1. 通过透射电镜分析显示,该方法可以制得多晶的InSb纳米颗粒,且颗粒均匀地...
X射线光电能谱仪 1. X-ray photoelectron Spectroscopy (XPS) measurements were executed to compare the nature of defects in those films. 采用化学溶液沉积(CSD)工艺在Si(100)衬底上制备了Bi2Ti2O7(BTO(和(LaxBi1-x)2Ti2O7(BLT(铁电薄膜,薄膜的X射线衍射(XRD)结果显示其具有较好的结晶性,运用X射线光...
X射线能谱仪1. APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS; 扫描电镜及X射线能谱仪在首饰镀层检测中的应用2. From the analysis of the EDS, we found that the ratio of the two elements approached 1:1. 通过透射电镜分析显示,该方法可以制得多晶的InSb纳米颗粒,且颗粒均匀地分布...
X射线能谱仪 1. APPLICATION OF SEM AND EDS IN INSPECTION OF PLATING ORNAMENTS; 扫描电镜及X射线能谱仪在首饰镀层检测中的应用 2. From the analysis of the EDS, we found that the ratio of the two elements approached 1:1. 通过透射电镜分析显示,该方法可以制得多晶的InSb纳米颗粒,且颗粒均匀地...