White light interferometry (WLI) is one of the Optical Profiler (OP) with a non-contact 3D optical method. This technology employs low coherence characteristics of white light to generate interference waves by reflecting light from objects and reference surfaces through a beam splitter which, in tu...
The use of White Light Interferometry to directly measure surface roughness on a variety of substrates and epitaxially grown materials is described. This method has many advantages for process development and monitoring compared to competing technologies as it offers the ability to rapidly image surfaces...
White-light interferometry is an established method for the measurement of the geometrical shape of objects. It can also be used for the measurement of the shape of objects with rough surfaces. Because of the rough surface, the phase of the white-light interferogram is not evaluated, the height...
White-light interferometry (coherence scanning interferometry) to Michelson: Areal, 3D measurement data, vertical resolution independent of field-of-view.
typically with less-than-ideal imaging or scattering. Understanding and characterizing the process used to make a surface can be critical to meeting the requirements of a particular application. 3-D optical profilers using scanning white-light interferometry (SWLI) are powerful tools for this ...
This webinar providesa comprehensive exploration of white light interferometry (WLI)-based advanced materials characterization, including techniques, practical considerations, and regulatory standards for such concepts as waviness, roughness, and spatial filtering. ...
White-light interferometry is a powerful tool for high resolution measurements on rough surfaces. The technology can be used for roughness measurements on technical surfaces with sub-μm tolerances. However, in automotive industry the surface of interest may be located inside a small drilling. In th...
Applied Surface Science Advances, Volume 9, 2022, Article 100250 Ilemona S. Omeje, Tatiana E. Itina A robust surface recover algorithm based on random phase noise correction for white light interferometry Optics and Lasers in Engineering, Volume 128, 2020, Article 106016 Long Ma,…, Jing-qiang...
rough and very smooth surfaces, an insensitivity to material type, and the capability for complete automation to measure a batch of parts and to perform pass-fail summaries based on user-specified parameters are some of the benefits offered by Bruker’s white light interferometry (WLI) technique....
There are several optical 3D measurements approaches, e.g.: triangulation, grating projection with phase shift, moiré with phase shift, confocal and (white light) interferometry (WLI) [2, 3]. They can measures: surface profile, roughness, step height, microstructure, and other surface parameters...