X-ray diffraction (XRD) is a technique used in materials science to determine the crystallographic structure of a material. XRD works by irradiating a material with incident X-rays and then measuring the intensities and scattering angles of the X-rays th
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This study presents the 51 mixtures of ceramic clays characterized by using XRF, XRD, granulometry, and dilatometry analyses. After firing in a 1000–1250°C range, water absorption (WA) according to EN standards by boiling in water, under vacuum, and by 24h soaking is determined. The ...
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Superior XRD metrology for wafer analysis is insufficient to deliver superior semiconductor materials and devices. Chemical mechanical polishing (CMP), both for substrate polishing and during processing, must be done in SEMI-standard fabs using a consistent, high-quality, and reliable method. A wafer...
What is photoluminescence? Photoluminescence (PL) can be a useful analytical method. We explain how PL relates to fluorescence and phosphorescence. Learn how you can tell apart PL features from Raman bands. We also offer practical tips on how to avoid unwanted fluorescence background in Raman spec...
Lifetimemeasurements of yrast levels in Yb and Hf were performedusing the recoil distance Doppler-shift method in coincidence mode. Excitedstates in Yb and... EA Mccutchan,NV Zamfir,RF Casten,... - 《Phys.rev.c》 被引量: 11发表: 2006年 ...