必应词典为您提供Wavelength-dispersive-spectroscopy的释义,网络释义: 射线荧光;波长散射谱;波长色散光谱分析法;
The X-rays emitted by the sample being analyzed are collimated by parallel copper blades (called or ), and irradiate a known single at a precise angle. The single crystal the photons () which are collected by a detector, usually a or a .Wavelength dispersive Xray spectroscopyCollimator...
系统标签: wdswdxdispersiveraywavelength色散 Wavelength-dispersive X-ray analysis (WDX or WDS)—Electron Probe Microanalysis (EPMA) Wavelength-dispersive spectroscopy (WDS) is the most directly comparable technique to EDX; both use electron-excited X-rays to allow characterization of a sample. The two...
英文名称:Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy 标准状态:现行 发布日期:2024-06-07 文档简介 ISO14594:2024是关于微束分析,电子探针显微分析,以及波长色散光谱分析的实验参数确定的指导方针。
Szlachetko, "Application of wavelength dispersive X-ray spectroscopy to improve detection limits in X-ray analysis," X-Ray Spectrometry, vol. 40, no. 1, pp. 2-6, 2011.M.Kavcić, M.Zitnik, K.Bucar, J.Szlachetko, Application of wavelength dispersive X-ray spectroscopy to improve ...
Standard Test Method for Determination of Trace Metals in Petroleum Coke by Wavelength Dispersive X-Ray Fluorescence Spectroscopy 用波长分散X射线荧光光谱仪检测石油焦炭中微量金属的试验方法 www.wwlww.com 6. Standard Practice for Correction of Spectral Line Overlap in Wavelength-Dispersive X-Ray Spectromet...
2) WDS,wave-dispersive X-ray spectroscopy 波长色散X-射线谱学3) X-ray wave length dispersive spectrometer X射线波长色散谱仪 例句>> 4) Portable Wavelength Dispersive X-Ray Fluorescence Spectrometer 便携式波长色散X射线荧光光谱仪5) wavelength-dispersive X-ray fluorescence spectrometry 波长色散X...
X-ray detector e.g. two-dimensional line camera, for e.g. wavelength-dispersive X-ray spectroscopy for analytical sampling of material, has scintillator layer arranged above sensor, where thickness of layer changes along lying directionThe detector (8) has a sensor or sensor chip (10) i.e....
- 《Spectrochimica Acta Part B Atomic Spectroscopy》 被引量: 2发表: 2015年 Determination of bromine in selected polymer materials by a wavelength-dispersive X-ray fluorescence spectrometric method — Critical thickness problem and... The purpose of this study was to develop an accurate method for...
Wavelength-dispersive X-ray (WDX) spectroscopy was used to measure silicon atom concentrations in the range 35-100 ppm [corresponding to (3-9) x 10(18) cm(-3)] in doped AlxGa1-xN films using an electron probe microanalyser also equipped with a cathodoluminescence (CL) spectrometer. Doping...