1.MOSDevice 以NMOS为例：Itemname Methodofmeasurement Ids Vd=Vg=Vdd,Vs=Vb=0,measureId,Ids=Id/Width Vt0Vt1IsubIoff Vd=0.1V,Vs=Vb=0,sweepVgfrom0Vto3V,usemaximumslopemethod,Vt0=Xintercept–1/2*Vd Vd=0.1V,Vs=Vb=0,sweepVgfrom0Vto2V,measureId,Vt1=Vg@Id=0.1uA*Width/Length Vd=...
2、trical test system for process goodness monitor.( Device characteristics, resistor, capacitor, interconnection, continuity, spacing, insulation, leakage) WAT is the primary quality element for a foundry FAB ( the quality assurance for wafer output) WAT characteristics: DC force and measurement, Au...
(Rsn*Wn/Ln+Rsm*Wm/Lm)*1/2*Ncon)]/NconNote:Rcneedtosubtractactive&Metalresistor,RsMetalcanbeignoredduetometalresistorisverysmall.ContactResistance(RcN+/P+/Vi6.BipolarDevice6.BipolarDeviceWATItemName(以NPN为例):HfeNpnBvNpnItemnameMethodofmeasurementHfeIb=1uA,Vce=Vdd,Hfe=Ic/IbBvBasefloating,...
(RsN+/P+/NW/Poly/Metal) Contact Resistance (RcN+/P+/Via) Item name Method of measurement Rc Vh=1V, Vl=GND, measure Ih, Rs=[(Vh/Ih)-(Rsn*Wn/Ln+Rsm*Wm/Lm)*1/2*Ncon)]/Ncon Note: Rc need to subtract active Metal resistor, RsMetal can be ignored due to metal resistor is ...
Wat wat考什么 Wat可Pp加5t时,动 trat可平it性了 Wat color is1pwa此? 二根据所给图片提示词及横线 bwat考试 备战WAT考试内容 wat中考 正文 WAT 地理复习提纲 3、四大洋:从大到小排列:太平洋、大西洋、印度洋、北冰洋。 §2.3 姓名: 世界的地形 七年级上册 1、常用的方法是用等高线来表示,等高线是把...
ContactResistance(RcN+/P+/Via) Note:Rcneedtosubtractactive&Metalresistor,RsMetalcanbeignoredduetometalresistorisverysmall. 6.BipolarDevice WATItemName(以NPN为例): HfeNpn BvNpn 7.LayoutRuleCheck Thanks! PPT文档内容仅供参考,如果您需解决具体问题,建议您详细咨询相关领域专业人士。实用...
WAT系统介绍HP4070ServerAgilent81110APulseGeneratorAgilent4284ACVMeterAgilentE4411BSpectrumAnalyzerAgilent4070内部结构Agilent3458ADigitMultimeter不同的机构都有各自的特点,把各种机构按结构加以分类,其目的是按其分类建立运动分析和动力分析的一般方法。WAT流程图不同的机构都有各自的特点,把各种机构按结构加以分类,其目的...
Hardware Software System Tester/Probe/Probe Card Test Pattern and Measurement WAT WATCH system WAT Test Items What is WAT ? Wafer Acceptance Test What kind of work? An electrical test system, non-productivity activity WAT is an electrical test system for process goodness monitor. Device ...
WAT测量项目以及测试方法 WAT测量项目以及测试方法 Thistemplateistheinternalstandardcoursewaretemplateoftheenterprise WATIntroduction 1.WAT是什么2.WAT系统介绍3.WAT测试项目及方法 ➢WAT是什么 WaferAcceptanceTest晶片允收测试 半导体硅片在完成所有制程工艺后,针对硅片上的各种测试结构所进行的电性测试。通过对WAT数据...
通过对WAT数据的分析，我们可以发现半导体制程工艺中的问题，帮助制程工艺进行调整。Agilent4284ACVMeter WAT系统介绍 ManualProber Agilent4156AIV Meter CascadeManualProber WAT系统介绍 Agilent4070 Agilent4070system TELP8XL WAT系统介绍 Agilent4070内部结构 Agilent81110APulseGHePne4r0a7to0rServer Agilent...