The invention discloses a wafer test probe card. The wafer test probe card comprises a base, a plurality of welding positions, a probe placing portion, a first probe group and a second probe group, the plurality of welding positions are arranged at specific positions of the base, the probe...
Discover our wafer test solutions for semiconductor manufacturing. Improve efficiency and reliability with Tektronix's advanced component solutions.
晶圆级测试依赖于探针卡（Probe Card），这是一个高精密度的测试装置，由多根微细探针组合而成，每根探针对应测试晶圆表面上的一个微小接触点。探针卡连接到测试设备，传递电信号，通过控制不同电信号的输入输出，检测每个裸芯片的电气性能。4. 晶圆级测试的重要性 晶圆级测试能够在早期生产阶段发现不良芯片，避免不...
The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management. Vertical Probe Card Currently, to meet the trend of high-precision miniaturization, WinWay has created miniature probes for micro-electronic mechanical processing. Learn more...
网络晶圆探针卡;晶圆测试卡 网络释义
晶圆级测试依赖于探针卡(Probe Card),这是一个高精密度的测试装置,由多根微细探针组合而成,每根探针对应测试晶圆表面上的一个微小接触点。探针卡连接到测试设备,传递电信号,通过控制不同电信号的输入输出,检测每个裸芯片的电气性能。 4. 晶圆级测试的重要性 晶圆级测试能够在早期生产阶段发现不良芯片,避免不合格芯...
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minimizes pad damage and allows for greater test uptime. In addition, the improved electrical performance of the TrueScale probe card family allows customers to fully test the performance limits of their devices at probe, ensuring confidence that devices meet performance specifications before they are ...
选择好测试机后,接下来就需要制作探针卡(ProbeCard)和测试程序(Test Program)。 ProbeCard包括探针和芯片外围电路。在芯片设计的时候,每一个DIE和DIE上的每一个芯片管脚的坐标和艰巨信息,都在投产之前已经确定,根据这些参数就可以开始制作探针了。可让芯片一个个去测量大耗时,因此探针卡还可以选择同测数(Site),可...
选择好测试机后,接下来就需要制作探针卡(ProbeCard)和测试程序(Test Program)。 ProbeCard包括探针和芯片外围电路。在芯片设计的时候,每一个DIE和DIE上的每一个芯片管脚的坐标和艰巨信息,都在投产之前已经确定,根据这些参数就可以开始制作探针了。可让芯片一个个去测量大耗时,因此探针卡还可以选择同测数(Site),可...