Pattern recognitionDeep convolutional neural networks (DCNN)Information entropy fusionThe objective of this paper is to propose a systematic failure pattern recognition for wafer map based on neural networks. A deep convolutional neural network (DCNN) model which includes the convolutional layer, batch ...
Section 2 describes the related work on wafer map defect pattern recognition and diffusion visual prediction. Section 3 introduces the overall architecture of the proposed method. Section 4 describes the datasets used in this paper and analyzes the experimental results. The conclusion is given in ...
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STDF to Wafer Bin Map utility written in Python atewafersemiconductor-devicesstdfwafermapwafer-mapwafer-mappingstdf-files UpdatedJul 12, 2018 Python PanithanS/Wafers-Defect-Recognition-using-Visual-Transformer Star29 We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect patter...
Defect pattern recognition (DPR) of wafermap, especially the mixed-type defect, is critical for determining the root cause of production defect. We collected a large amount of wafer map data in a wafer manufacturing plant. These wafer maps are obtained by testing the electrical performance of ea...
因为wafer map的像素和一个die是一样的，所以对于die size比较大wafer map来说，意味着像素太少，很难...
Introduction Many readers may be wondering, what is a wafer map? First, wafers are thin slices of semiconductor material (usually silicon) which serve as a substrate to fabricate microchips ("chips"/"dies") or solar cells. Wafers are circular, per the manufacturing process, and chips are rect...
“Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets.” IEEE Transactions on Semiconductor Manufacturing 28, no. 1 (February 2015): 1–12. https://doi.org/10.1109/TSM.2014.2364237. [2] Jang, Roger. "MIR Corpora." http://mirlab.org/dataset/public/. [3...
This paper proposes a wafer map defect recognition (WMDR) model based on integration of deep transfer learning and deep forest. Firstly, we transfer the network weight parameters of ImageNet to the convolutional neural network (CNN) (i.e., densely connected convolutional network (DenseNet)) and...
Wafer bin map (WBM) is outcome of circuit probe (CP) process, which records the spatial distribution of defect dies on the wafer. WBM spatial patterns contain potentially useful information, in which specific pattern refers to potential failure of a specific manufacturing process. Thus, analyzing ...