Type Vacuum Cleaner PartsDescriptionReport Item Specifications: Vacuum Part Type: Bags Compatibility: Bosch Microfibre Type G, GXXL, GXL, MegaAir, SuperTex Quantity: 10 pieces Design: Hygiene shutter for safe disposal Performance: 50% more space inside the bag Compatible Models: BSG, BSGL5, BGL45...
Part Name Washable Vacuum Cleaner HEPA Exhaust Air Filter BBZ156HF Replacement for Boschs GL-10 GL-40 00576833 Vacuum Cleaner BGL35 Part NO. BS857 To Fit Replace for Boschs GL-10 GL-40 00576833 Vacuum Cleaner BGL35 HEPA...
High Quality Blue Vacuum Cleaner Dust HEPA Filter Bbz156hf Replacement for Boschs Gl10 Gl40 00576833 Vacuum Cleaner Accessories US$0.10-5.10 500 Pieces (MOQ) Product Description Company Info Basic Info. Type Dust Bag Material Non-Woven Fabric ...
More power options added to mobile vacuum pump range - ScienceDirectThe linear pumps in the Series 6000 from Rietschle Thomas can now be specified with 12 V and 24 V DC power options. In addition, there is also a new 24 V AC-version available to end-users in the scientific community ...
Information about a new book on vacuum from the USSR: Molecular flow in complex vacuum systemsdoi:10.1016/S0042-207X(80)80749-4G.L.SaksaganskySDOSVacuum
The Measurement of Optical Constants in the Vacuum Uv Region Final Report, 1 Nov. 1961 - 30 Jun. 1969MonochromatorsOptical propertiesReflectometersUltrahigh vacuumContaminationEnergy dissipationPolarization (waves)ReflectanceWeissler, G. LUniversity of Southern Calif....
A specimen-exchange device for an ultra-high vacuum atom-probe field-ion microscopedoi:10.1016/S0042-207X(80)80699-3SDOSVacuum
L. Pakhomov, "Ultrathin metallic inter- layers in vacuum deposited MoOx/metal/MoOx electrodes for organic solar cells," Applied Surface Science, vol. 390, pp. 703-709, 2016.Travkin, V.V.; Luk'yanov, A.Y.; Drozdov, M.N.; Vopilkin, E.A.; Yunin, P.A.; Pakhomov, G.L. Ultra...
Secondary ion mass spectrometry (SIMS) of silicon: M. Grasserbauer and G. Stingeder. Vacuum39(11/12), 1077 (1989)doi:10.1016/0026-2714(90)90662-7ELSEVIERMicroelectronics Reliability
Fast ion induced defects in silicon and semiconductor applications: A. Hallen, P. Hakansson and B. U. R. Sundqvist. Vacuum 39(2–4), 199 (1989)doi:10.1016/0026-2714(90)90152-DELSEVIERMicroelectronics Reliability