book{4209930, editor = {Cnudde, Veerle}, isbn = {9789461971302}, language = {eng}, pages = {IX, 328}, title = {Tomography of materials and structures: book of abstracts: posters: 1st international conference on tomography of materials and structures; ICTMS 2013, July 1-5 (Ghent, Belgium...
The newly-established Journal for Tomography of Materials and Structures (JTMS) provides a platform for all research related to computed tomography for materials sciences, including both methodological and applied research using all forms of computed tomography. The development, application and widespread ...
Tomography of Materials and Structures Articles in press This journal currently does not have articles in press Note to users: Articles in press are peer reviewed, accepted articles to be published in this publication. When the final article is assigned to volumes/issues of the publication, the ...
Organoid and spheroid technology provide valuable insights into developmental biology and oncology. Optical coherence tomography (OCT) is a label-free technique that has emerged as an excellent tool for monitoring the structure and function of these samp
Typical properties and defect structures in composites are well characterized by high resolution X-ray tomography. This NDE method can be particularly used in the development of materials to reduce time consuming methods like micrographs, if the time scale is appropriate even time dependent processes ...
With an efficient system for 3D-microfocus-computed-tomography, the analysis of materials, weldings, joinings and structures is possible with high resolution. In the research center Julich such a tomographic system is available and has been developed continuously for a wide range of applications. ...
The structures of the inclusion considered in the simulations were simple. Especially the blood-vessel-mimicking inclusions were too coarse to represent realistic blood vessels found in biological tissues. Reconstructing more complex structures necessitates on usage of finer discretization of the parameters...
However, their results extend only up to the layer of the Earth’s crust; the tomographic results have not shown anomalies of 3D velocity structures due to volcanic activity in the subduction zone. The research undertaken in this study made use of local and regional data from BMKG (Figure 1...
Atom- probe tomography of semiconductor materials and device structures. MRS Bull. 2009;34(10):738-743.Lauhon, L.J., Adusumilli, P., Ronsheim, P., Flaitz, P.L. & Lawrence, D. (2009) Atom-probe tomography of semiconductor materials and device structures. MRS Bull. 34, 738-743....
Egan C K, Jacques S D M, Wilson M D, Veale M C, Seller P, Pattrick R A D, Withers P J and Cernik R J 2017 3D elemental mapping of materials and structures by laboratory scale spectroscopic x-ray tomography J. Phys.: Conf. Ser. 849 ...