This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 8 5 V = VIC 1 4 Figure 4. Isolation Metal Around Device Inputs (JG and P packages) low-level output voltage To obtain ...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 7 1 V = VIC 8 14 Figure 4. Isolation Metal Around Device Inputs (J and N packages) low-level output voltage To obtain ...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 7 1 V = VIC 8 14 Figure 4. Isolation Metal Around Device Inputs (J and N packages) low-level output voltage To obtain ...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 7 1 V = VIC 8 14 Figure 4. Isolation Metal Around Device Inputs (J and N packages) low-level output voltage To obtain ...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 8 5 V = VIC 1 4 Figure 101. Isolation Metal Around Device inputs (JG and P packages) low-level output voltage To obtain...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 8 5 V = VIC 1 4 Figure 4. Isolation Metal Around Device Inputs (JG and P packages) low-level output voltage To obtain ...
6.5 Electrical Characteristics TA = 25°C, over recommended operating conditions (unless otherwise specified) PARAMETER TEST CONDITIONS POWER SUPPLIES (VCC, PGND, GND) ICC Supply current V(POR-rising) Power-on reset voltage, rising V(POR-falling) Power-on reset voltage, falling V(POR-hyst) POR...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 85 V = VIC 14 Figure 4. Isolation Metal Around Device Inputs (JG and P packages) low-level output voltage To obtain low-...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 85 V = VIC 14 Figure 4. Isolation Metal Around Device Inputs (JG and P packages) low-level output voltage To obtain low-...
This method requires that a device be inserted into the test socket to obtain a correct reading; therefore, an open-socket reading is not feasible using this method. 71 V = VIC 8 14 Figure 4. Isolation Metal Around Device Inputs (J and N packages) low-level output voltage To obtain ...