aX-ray diffraction (XRD) was performed using a Philips diffractometer, model PW 1410, operating with Cu Karadiation (40 kV, 30 mA) and a Ni filter. The angular range varied from 20 to 908, with increments of 0.058 and counting time of 8 s per step X-射线衍射 (XRD) 使用Philips衍射计...
Time-re solved XRD (trXRD) is a very suit able tool for study ing the phase trans for ma tions of the sys tem as well as for fol low ing melt ing and so lid i fi ca tion pro cesses. It is be ing used ex ten sively in our re search and may be pre sented in mov ies....
X-ray diffraction (XRD) spectra of catalysts (phase analysis) were recorded on a Stoe Stadi-P diffractometer with a monochromatic Cu-Kα1 radiation from a germanium monochromator in the angular range 20◦ 2θ 70◦,with a step width of 0.04◦ and count time of 5 s per step....
Fig. 6. Three-dimensional representation of in situ XRD patterns recorded during reduction of a Cu/ZnO methanol synthesis catalyst. The collection time per diagram was 60 s[adapted from Clausen et al. (32)]. B EXAFS X-ray absorption spectra are most commonly recorded in transmission or fluore...
XRD was used to investigate the phase and structure of the generated Pd–Pt composite nanoparticles. The diffraction peaks at 2\(\theta\) of 39.53°, 46.03°, and 67.86° correspond to diffractions from (111), (200), (220) planes of face-centered-cubic (fcc) structure which confirms the...
The temperature and time of austenitization are of great practical importance during the austempering heat treatment of ductile iron, as these factors influence the transformations in the solid state, modifying the matrix microstructure and the resulting mechanical properties of the material obtained after...
The MA cation have higher dipole moment than FA in a cubic phase per- ovskite lattice at room temperature3,45. Then, the MA rotation intensity is expected to increase easier than the FA with the collisions of the hot carriers. This assumption has been confirmed by further experiments in ...
aThe powder XRD pattern for Rietveld analysis were measured with a step(countingtime:2s step1) width of 0.021 in the 2y range between 10 and 801 粉末XRD样式为Rietveld分析测量了以步(countingtime :2s 步 1)宽度0.021在2y范围在10和801之间[translate]...
The XRD patterns of the 1.0 µm NPs were recorded by an XRD-7000 diffractometer. A Zetasizer Nano ZSP instrument (Malvern Co., UK) was used to determine the zeta potentials of the water-heating NIR NPs. The Fourier transform infrared (FT-IR) spectra of the water-heating NIR NP ...
You can use OFFSET to calculate the individual gaps per equipment and then average it for each equipment. Then what? Average that average across equipments? Any weighting? Message 2 of 14 222 Views 0 Reply shreep1 Helper II In response to lbendlin 05-01-2024 07:26 AM Hello @...