Understand what a thin lens is. Learn what the thin lens equation is and what it can predict. Practice using the equation with thin lens example...
thin lens approximationA thin lens formula, whose object and image planes are measured from the lens center, is derived for electrostatic bi-potential lenses. Its approximation degree is discussed.doi:10.1078/0030-4026-00310Katsumi Ura1: Professor Emeritus of Osaka University, 1-14-9 Takakura-chou...
Planes in the Thin Lens Model: single twice Planes in the Thick Lens Model: two How to draw construction rays Warning:The principal planes in both a thin lens and thick lens are hypothetical planes.Light does not actually refract there.Drawing rays that refract at the principal planes accuratel...
Here, we present the first results of a 3D tomographic reconstruction of a magnetic thin film heterostructure, 240 nm thick, using transmission soft X-ray microscopy and a recently developed vector reconstruction method21. This combination revealed the 3D magnetization vector m in an arbitrary conf...
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In the Takabayashi device, the number of minima or fringes are counted and used to derive information about layer thickness. Takabayashi is therefore limited to measuring relatively thick thin film layers which will generate the multiple fringe effects. In addition, because Takabayashi forces the ...
The designed structure is compatible with nanofabrication techniques. 15-nm-thick Ag and 40-nm-thick Al2O3films were subsequently deposited on the glass substrate by electron beam evaporator. To fabricate Ag metasurface (grating structure), positive electron beam resist (ZEP 520 A) was spin-coa...
derived by means of RayleighSommerfeld Diffraction theory, Further, under near-axis, by using higher-grade approximate method than that of Fresnel, a simplified Reyleigh-Sommerfeld Diffraction Formula, which is applicable to acoustic fields formed by the thin acoustic lens with larger aperture, is ...
We plot the BFP PL signal for 550 nm, 600 nm, 700 nm, and 790 nm emission wavelengths from an 88 nm thick flake in Fig. 2d. We note this signal was extremely difficult to measure due to competing luminescence from the objective lens (which was much more strongly focused in...
Using a thick film with thicker than 500 nm and a field-emission scanning electron microscope (SEM) (JSM-6700F, JEOL Co., Ltd., Tokyo, Japan) aided by a surface profilometer (Alpha-Step 500, KLA-Tencor, Milpitas, CA, USA), the thickness of each film was calibrated to precisely ...