Integrated light microscope for correlative targeting Download datasheet Iliad (S)TEM Advanced integration of EELS and SEM optics Electrostatic beam blanker High energy resolution electron source View product Download datasheet Krios G4 Cryo-TEM
Electron microscopes reveal hidden wonders that are smaller than the human eye can see. They fire electrons and create images, magnifying micrometer and nanometer structures by up to ten million times, providing a spectacular level of detail, even allowi
Integrated light microscope for correlative targeting View product Download datasheet Iliad (S)TEM Advanced integration of EELS and SEM optics Electrostatic beam blanker High energy resolution electron source View product Download datasheet Krios G4 Cryo-TEM Improved ergonomics Fits more easily into new ...
Helios 6 HD Focused Ion Beam Scanning Electron Microscope The Thermo Scientific™ Helios 6 HD FIB-SEM is designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology. This latest addition to the Thermo Scientific family of industry standard ...
3D visualization and analysis software for electron microscopy data acquisition, analysis and reconstruction.
Thermo Fisher Scientific Electron Microscope Upgrade Program Regularly upgrading your microscope allows you to enhance the capabilities of current system and utilize the instrument in the most effective and productive way possible. Microscope upgrades can expand the range of applications your instrument can...
Phenom Desktop SEM (desktop scanning electron microscopes) provide similar information to traditional SEMs but with improved ease of use and a smaller footprint.
The microstructural characterization of the Na-Mt was performed by scanning electron microscope (FEI QUANTA 400 SEM/ESEM, Fei Quanta, Hillsboro, WA, USA) and the chemical composition of the bentonite was estimated (Table 3) using the energy dispersive X-ray spectroscopy (EDS/EDAX, PAN’alytical...
The surface morphology of fractured specimens was analyzed by applying the scanning electron microscopy (SEM) technique, EVO 50 microscope from Carl Zeiss AG (Jena, Germany) [25]. 3. Results and Discussion Figure 2 exhibits the engineering strain curves for titanium (a), Zr-1Nb (b) and ...