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IDDQ Testing of VLSI Circuits - Gulati, Hawkins - 1993R.K. Gulati and C.F. Hawkins, IDDQ Testing of VLSI Circuits. Bos- ton: Kluwer Academic, 1992.R. K. Gulati and C. F. Hawkins, I DDQ Testing of VLSI Circuits. Boston, MA: Springer, 1993....
Delay Fault Testing for VLSI Circuits 作者:Angela Krstic/Kwang-Ting (Tim) Cheng 出版社:Springer 出版年:1998-10-31 页数:208 定价:USD 155.00 装帧:Hardcover ISBN:9780792382959 豆瓣评分 目前无人评价 评价: 写笔记 写书评 加入购书单 分享到 + 加入购书单...
TY - JOUR T1 - Survey of Low Power Testing of VLSI Circuits AU - P. Basker AU - A. Arulmurugan Y1 - 2013/05/20 PY - 2013 N1 - https://doi.org/10.11648/j.cssp.20130202.15 DO - 10.11648/j.cssp.20130202.15 T2 - Science Journal of Circuits, Systems and Signal Processing JF - Scien...
In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip...
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7. The testing system of claim 6 wherein the tester speed is substantially lower than the circuit speed. Description: IA. FIELD OF THE INVENTION The present invention relates to testing systems, including testing of VLSI circuits. Specifically, the present invention relates to testing high-speed ...
P. Girard, “Survey of Low-Power Testing of VLSI Circuits,” IEEE Design & Test of Computers, vol. 19, no. 3, May-June 2002, pp. 82-92. 4. K. Mei, “Bridging and Stuck-At Faults,” IEEE Trans. Computers, vol. 23, no. 7, July 1974, pp. 720-727. 5. G.L. Smith, “...
第 1 页 共 4 页 Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits 测试的流程 测试的分类 测试效率- -故障覆盖率（Fault Coverage ，FC ）对于给定的故障模型，FC=测试图形所能检测到该类型故障 的数目/电路中可能存在的所有该故障类型数目*100% 测试经济学 ...
The aim of testing of VLSI circuits is high-quality screening of the circuits by targeting performance- related faults. Though a compact check set with extremely effective patterns, every police work multiple delay faults is fascinating for lower check prices, such patterns increase shift activity th...