In certain applications such, for example, as small communication systems, it is advantageous...doi:US2211421Herrick Roswell HUS2211421 * 1938年1月10日 1940年8月13日 Associated Electric Lab Inc Cathode heater testing circuit for a vacuum tube network...
An integrated circuit (IC) package testing apparatus (Figure 5) integrates a temperature sensor (48), heater (or cooler) (44), and controller (42) within a single modular unit (22). The controller is a microprocessor embedded within the modular unit in communication with the sensor and heate...
FIG. 1 is a block diagram showing the configuration of a magnetic head testing apparatus of this embodiment. FIG. 2 is a diagram for explaining the structure of the TMR element (TMR sensor) of this embodiment. (Structure of the TMR element) ...
Auto water tank expansion blasting testing machine ,Pulse pump generates pressure, pressure sensor collects pressure, operating software controls pressure, pressure pulse fatigue test is realized. Scope ... Compare this product See the other productsHCTE PTE. LTD. air thightness testing machineHCTE...
These temperatures are considered for simplicity as the inlet temperatures of the corresponding hydraulic circuit. In phase 2, the performances of the eCoo10 adHP were characterized with reduced flow rates for the same temperatures as before. These reduced flow rates corresponded to 40% of their ...
However, by changing the conditions in the room in a controlled way (e.g., switching on the light or switching on the heater), it was possible to observe the behavior of the sensors. The air speed values provided with the EE650 sensor that gives an insight into air draught were below ...
An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected...
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INTEGRATED CIRCUIT TESTING SYSTEM, AND HEATER STRUCTUREPROBLEM TO BE SOLVED: To provide a test system and heater structure capable of testing respective integrated circuits at respective different temperatures.LIN YIH-MING林益民
a light source may then be used to illuminate the test strip21(not illustrated in these figures) through an aperture in a circuit board. In this embodiment, light may reflect off the test strip21, which can then be focused onto an optical sensor positioned relative, for example, from above...