Automatic Test Data Generation using Genetic Algorithm and Program Dependence Graphs. Information and Software Technology, 48(7):586-605, July 2006. (Cited on page 16.)J. Miller, M. Reformat, and H. Zhang, "Automatic Test Data Generation Using Genetic Algorithm and Program Dependence Graphs,"...
Different test data generation methods like random test data generator, symbolic evaluator, function minimization method and metaheuristic search methods had been proposed in the literature. The paper explores the Genetic Algorithm approach to generate adequate and accurate test data for a target path...
Using genetic algorithm to transform test data generation problem into numerical optimization problem, evolution test is one of the hot topics in test data automatic generation. This paper proposed a software test data generation method based on evolution test, which was output-oriented and so ...
These approaches include genetic algorithm, cuckoo search, tabu search, intelligent water drop, etc. This paper presents an effective approach for test data generation using the cuckoo search and tabu search algorithms (CSTS). It combines the cuckoo algorithm's strength of converging to the solution...
Saha, S., Chakraborty, R., Nuthakki, S., Anshul, Mukhopadhyay, D.: Improved test pattern generation for hardware trojan detection using genetic algorithm and boolean satisfiability. In: Cryptographic Hardware and Embedded Systems (CHES), pp. 577-596 (2015)...
The underlying strategy for test data generation of the proposed framework is called by Map-only job. This is designed by amalgamation of genetic and particle swarm optimization algorithm. Rather than applying the velocity and distance update rules to the particles for updating their values, we ...
An Enhanced Genetic Algorithm for Optimized Educational Assessment Test Generation Through Population Variation doi:10.3390/bdcc9040098Big Data & Cognitive ComputingPopescu, Doru-Anastasiu
Using Genetic Algorithms to Aid Test-Data Generation for Data-Flow Coverage This paper presents an automatic test-data generation technique that uses a genetic algorithm (GA) to generate test data that satisfy data-flow coverage cr... AS Ghiduk,MJ Harrold,MR Girgis - Asia-pacific Software Engin...
N. Gockel, M. Keim, R. Drechsler, and B. Becker. A genetic algorithm for sequential circuit test generation based on symbolic fault simulation. In European Test Workshop, 1997.A genetic algorithm for sequential circuit test generation based on symbolic fault simulation - Gockel, Keim,...
Objective: This paper emphasizes the problem of test data generation for parallel programs, and presents a feedback-directed genetic algorithm for generating test data of path coverage. Method: Information related to a schedule sequence is exploited to improve genetic operators. Specifically, a ...