EN Log in Deliver the highest quality deterministic scan test with the lowest manufacturing test cost, using patented on-chip compression to reduce test data volume and cut test time. Automate the generation and insertion of IEEE 1838-compliant hardware and define the IEEE test access architecture ...
EN Log in Tessent UltraSight-V End-to-end RISC-V debug and trace solution consisting of embedded IP and software designed to provide comprehensive, efficient debugging and trace capabilities. System debug Accelerate debug, validation and optimization of complex multicore SoCs. Leverage embedded, non...
基于经过市场验证的 Tessent™ MissionMode 技术和 Tessent Streaming Scan Network (SSN) 软件,西门子 Tessent In-System Test 可无缝集成由 Tessent™ TestKompress™ 软件生成的确定性测试向量。该软件使客户能够在系统内应用中复用现有的基于 IJTAG 和 SSN 的向量,同时改善整体芯片规划并缩短测试时间。 Tessent...
基于经过市场验证的Tessent™ MissionMode 技术和 Tessent Streaming Scan Network (SSN) 软件,西门子Tessent In-System Test可无缝集成由Tessent™ TestKompress™ 软件生成的确定性测试向量。该软件使客户能够在系统内应用中复用现有的基于 IJTAG 和 SSN 的向量,同时改善整体芯片规划并缩短测试时间。 Tessent In-S...
edt_update和scan_en信号是必须的 4. 进行DRC检查 先在SETUP 模式下配置,关闭BIST/JTAG相关选项: set_dft_specification_requirements -memory_test off -memory_bisr_chains off -memory_bisr_controller off -boundary_scan off -logic_test on check_design_rules #进行DRC规则检查 ...
signals,suchasedt_bypass,edt_update,scan_en,andtodisabletheedt_clockinfunctional 20TessentTestKompressUser’sManual,v2013.2 May2013 GettingStarted UnderstandingCompressionLogic mode.Fordetailedinformationabouthowtodothiswithboundaryscan,referto “UncompressedATPG(ExternalFlow)andBoundaryScan”onpage183. LogicCloc...
1.MBISTPG_EN =1 High 2.BIST_SETUP[1:0] = 10 测试开始前的Clock 时钟周期由MBISTPG_EN =1 拉高的时候,开始指示测试Clock开始.Test 完成之后,表征测试状态的Status Register的 Done = 1 ;在测试过程中GO 信号一直拉高。一旦出现问题后 GO 拉低,然后直到测试结束。
. . . Scan Sequential ATPG with the ATPG Tool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Understanding Test Types and Fault Models . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
“Leveraging the Observation Scan technology featured in the new Tessent LBIST-OST solution, we were able to reduce the test time for in-system Logic BIST by 5x, thereby enabling a much faster coverage ramp up,” said Hideyuki Okabe, director, Digital Desi...
ATPG user guide[tessent 2015]; Tessent scan and ATPG user Manual, version: 2015.2 上传者:snail_new时间:2018-09-11 可测性设计与ATPG生成 1. 可测性设计DFT(Design for Test) 2. ATPG(Auto-Test Pattern Generation),自动测试向量生成 上传者:wownga时间:2024-05-09 ...