可以报告 atpg_untestable fault分析stuck_at 1故障, stuck_at 0的故障是如何被测试到的: ANALYSIS> analyze_fault /u_cm3_dpu_br_dec/U1987/A -stuck_at 0 ANALYSIS> analyze_fault /u_cm3_dpu_br_dec/U1987/A -stuck_at 1分析要关注 a. 工具是否可以激活stuck_at 1故障?
Diagnose and analyze failure and yield data on individual customer returns or volume production data. Get valuable design and process feedback to improve the reliability of future processes and designs. Discover related technologies Learn more about how Tessent Safety and Security can help you meet yo...
usedforyourdesign.Usethissteptoanalyzebothchip-levelandblock-leveldesigns. Forexample: set_fault_typestuck set_fault_sampling5 analyze_compression Thetoolanalyzesthedesignandreturnsarangeofchain:channelratiovaluesbeginning withtheratiowhereanegligibledropinfaultcoverageoccursandendingwiththeratio wherea1%dropinfa...
. . 193 signatureAnalyze Fault Simulator Diagnosis Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193 Overview of the signatureAnalyze Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ....
Setup and analyze designs to prepare for ATPG Perform ATPG to achieve high test coverage with a minimal number of patterns Troubleshoot DRC violations Troubleshoot areas of low test coverage Troubleshoot simulation mismatches Hands-on labs Accessing documentation and getting help Using the scan and AT...
. . . . 213 Analyze and Insert Test Points in a Post-Scan Design . . . . . . . . . . . . . . . . . . . . . . . . . . . . 215 How to Insert Test Points and Perform Scan Stitching Using Third-Party Tools . . . . . . . 220 How to Insert Test Points for ...
The Clocks Browser allows you to navigate through the design hierarchy and view the faults for each individual clock and analyze the distribution of faults between clock domains. Note Currently, the Clocks Browser does not support the UDFM fault type. • Signals Window — Displays pins and ...