Due to the requirement for transmitted electrons, TEM samples must be very thin (generally less than 150 nm) and in cases that high-resolution imaging is required, even below 30 nm, whereas for SEM imaging, there is no such specific requirement. ...
Due to the requirement for transmitted electrons, TEM samples must be very thin (generally less than 150 nm) and in cases that high-resolution imaging is required, even below 30 nm, whereas for SEM imaging, there is no such specific requirement. This reveals one more major difference b...
Although SEM imaging showed a similar interface contrast for both Si 3 N 4 and SiC ceramics, HRTEM studies clearly revealed grain-boundary wetting in the former and clean interfaces in the latter material, respectively. Hence, SEM imaging and Fresnel fringe TEM imaging alone are not conclusive ...
球差电镜最大的优点是球差校正消减像差以提高分辨率。传统TEM的分辨率在纳米级、亚纳米级，而AC-TEM的分辨率能达到埃级，甚至亚埃级别（当前AC-TEM的最大分辨率可达到0.06 nm）。分辨率的增加，意味着可以更加精细和精确地表征材料的结构。HAADF STEM imaging of Gallium Nitride in 211 Projection 四、AC-TEM应用...
HAADF STEM imaging of Gallium Nitride in 211 Projection 四、AC-TEM应用 1、TEM模式 低倍形貌像、高分辨像、衍射、会聚束衍射、纳米束衍射,EFTEM(配GIF系统),高分辨图像透射束和衍射束的相干像,衬度与焦聚有关,如果要解析原子结构像,样品要求较薄,现在使用不多。但如果想做原位电子显微学研究,一般都在此模...
HAADF STEM imaging of Gallium Nitride in 211 Projection 四、AC-TEM应用 1、TEM模式 低倍形貌像、高分辨像、衍射、会聚束衍射、纳米束衍射,EFTEM(配GIF系统),高分辨图像透射束和衍射束的相干像,衬度与焦聚有关,如果要解析原子结构像,样品要求较薄,现在使用不多。但如果想做原位电子显微学研究,一般都在此模...
An alternative method to TEM analysis is STEM-SEM, in which electron transparent samples can be imaged in the SEM in combination with a STEM detector to perform high resolution imaging and EDS. As the samples analysed are electron transparent, we see a significant improvement in the spatial reso...
HAADF STEM imaging of Gallium Nitride in 211 Projection 四、AC-TEM应用 1、TEM模式 低倍形貌像、高分辨像、衍射、会聚束衍射、纳米束衍射,EFTEM(配GIF系统),高分辨图像透射束和衍射束的相干像,衬度与焦聚有关,如果要解析原子结构像,样品要求较薄,现在使用不多。但如果想做原位电子显微学研究,一般都在此模...
HAADF STEM imaging of Gallium Nitride in 211 Projection 四、AC-TEM应用 1、TEM模式 低倍形貌像、高分辨像、衍射、会聚束衍射、纳米束衍射,EFTEM(配GIF系统),高分辨图像透射束和衍射束的相干像,衬度与焦聚有关,如果要解析原子结构像,样品要求较薄,现在使用不多。但如果想做原位电子显微学研究,一般都在此模...
Imaging/Mapping:Yes (EDS, EELS) Ultimate Lateral Resolution:<0.2 nm Would you like to learn more about using TEM and STEM? Contact us today for your Transmission Electron Microscopy and Scanning TEM needs. Please complete the form below to have an EAG expert contact you. ...