tem h 7100 hitachi japan- byBioz Stars,2025-03 86/100stars Buy from Supplier tem hitachi h 7100 japan(Hitachi Ltd) 86 Hitachi Ltdtem hitachi h 7100 japan Tem Hitachi H 7100 Japan, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citatio...
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Takayoshi TanjiResearch Institute for Scientific Measurements Tohoku University, Katahira, Sendai, 980 JapanMasahiro TomitaNaka Works, Hitachi Ltd., Katsuta, 321 JapanHiroyuki KobayashiNaka Works, Hitachi Ltd., Katsuta, 321 JapanJohn Wiley & Sons, LtdJournal of Electron Microscopy Technique...
2000年6月 材料研究 GHINESEJoURNALoFMATERIALSRESEARCH ,T0l_14No3 June2000 卜 Al—Li-Mg—Si合金的相图计算 及组织的TEM观察 陈荣黄正张永刚陈昌麒 f]E京航空航天大学) 沈剑韵_''._'一 (]E京有色金属研究总院) legJ 弋Gi|l 摘要舟析了Li加^Al—Mg—Si悻系后相的析出和组织变化.计算了几十典型的...
tem h 7100 hitachi japan- byBioz Stars,2025-03 86/100stars Buy from Supplier tem hitachi h 7100 japan(Hitachi Ltd) 86 Hitachi Ltdtem hitachi h 7100 japan Tem Hitachi H 7100 Japan, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citatio...
Kubozoe, K.Naka Works, Hitachi, Ltd., Katsuta, Ibaraki, JapanTomita, M.Naka Works, Hitachi, Ltd., Katsuta, Ibaraki, JapanMatsui, I.Naka Works, Hitachi, Ltd., Katsuta, Ibaraki, JapanIsakozawa, S.Naka Works, Hitachi, Ltd., Katsuta, Ibaraki, JapanKamimura, S....
After TEM examination (H-7100, Hitachi, Japan), the grids were coated with carbon and observed under a field emission scanning electron microscope (FESEM, 4500S, Hitachi-Japan) equipped with energy dispersive X-ray analysis (EDS). Results: FESEM showed the outer lesion (depth of 15-20 矛...
Takashi KanemuraTakeo KaminoJapan Automobile Research Institute, 2530 Karima, Tsukuba 305-0822, JAPAN;Japan Automobile Research Institute, 2530 Karima, Tsukuba 305-0822, JAPAN;Hitachi High-Technologies Corporation, 882 Ichige, Hitachinaka 312-8504, JAPAN;Hitachi High-Technologies Cor...
9th China-Japan Symposium on Materials for Advanced Energy Systems and Fission & Fusion Engineering jointed with CAS-JSPS Core-university Program Seminar on Fusion Materials, System and Design Integration 2007 . 2007Guo LP, Li M, Liu CS, Song B, Fu DJ, Fan XJ: In situ TEM-tandem/implanter...
Transmission electronic microscope (TEM) images were obtained from a TEM system (Hitachi 7600 TEM, Hitachi, Tokyo, Japan) with an accelerating voltage of 75 keV. For ImageJ and Origin, each historic version was available; here ImageJ 1.53 t bundled with 64-bit and Origin 9.1 32-bit were ...