The new Heidelberg proton microprobe uses the method of Proton Induced X-ray Emission (PIXE) for elemental analysis. This microprobe is an appropriate instrument to measure distributions of trace elements with a
The process uses a base composite film of a support substrate, a seed layer, a multilayer thin film of FeNi with alternating single atomic layers of Fe and Ni that mimics the atomic plane of the final L1 0 FeNi alloy, and a capping layer. The Fe and Ni bilayers are grown on top of...
The process uses a base composite film of a support substrate, a seed layer, a multilayer thin film of FeNi with alternating single atomic layers of Fe and Ni that mimics the atomic plane of the final L1FeNi alloy, and a capping layer. The Fe and Ni bilayers are grown on top of a ...
The process uses a base composite film of a support substrate, a seed layer, a multilayer thin film of FeNi with alternating single atomic layers of Fe and Ni that mimics the atomic plane of the final L10#191 FeNi alloy, and a capping layer. The Fe and Ni bilayers are grown on top ...
The process uses a base composite film of a support substrate, a seed layer, a multilayer thin film of FeNi with alternating single atomic layers of Fe and Ni that mimics the atomic plane of the final L10 FeNi alloy, and a capping layer. The Fe and Ni bilayers are grown on top of a...
The process uses a base composite film of a support substrate, a seed layer, a multilayer thin film of FeNi with alternating single atomic layers of Fe and Ni that mimics the atomic plane of the final L10 FeNi alloy, and a capping layer. The Fe and Ni bilayers are grown on top of a...