System-on-Chip.Test.Architectures.iNTERNAL 下载积分: 100 内容提示: 文档格式:PDF | 页数:893 | 浏览次数:101 | 上传日期:2009-02-03 13:50:02 | 文档星级: 阅读了该文档的用户还阅读了这些文档 33 p. ARCEHC20DS01 2 p. 预防缺陷 309 p. Advances in Queueing Theory and Network Application...
Wang L-T, Stroud CE, Touba NA (2008) System on chip test architectures. Morgan KaufmannLaung-Terng Wang, Charles E Stroud & Nur A. Touba, "System-on-Chip Test Architectures", Morgan Kaufmann, San Francisco, 2008L. T. Wang, C. E. Stroud, and N. A. Touba, System-on-Chip Test ...
around an ARM core deeply embedded into a complex system chip represents the cutting-edge of technological development today. Book Structure Chapter 1 starts with a refresher on first year undergraduate processor design mate- rial. It illustrates the principle of abstraction in hardware design by ...
System-on-Chip Test Architectures || Design for Debug and Diagnosis This is a review of System on Chip Test Architectures: Nanometer Design for Testability (edited by Laung-Terng Wang, Charles E. Stroud, and Nur A. Touba). ... TM Mak 被引量: 0发表: 2008年 System-on-a-chip test-dat...
book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs....
INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TESTDESIGNAND OPTIMIZATIONFRONTIERS IN ELECTRONIC TESTING Consulting Editor Vishwani D. AgrawalBooks in the series:Embedded Processor-Based Self-Test D. Gizopoulos ISBN: 1-40
A system, an IC chip, a test structure formed on the IC chip, and a corresponding method for modeling one or more target interconnect capacitances is disclosed. The test structure comprises an interconnect configuration comprising a test interconnect and one or more target interconnects. The interc...
出版社:Morgan Kaufmann 副标题:Nanometer Design for Testability 出版年:2007-12-4 页数:896 定价:USD 84.95 装帧:Hardcover ISBN:9780123739735 豆瓣评分 评价人数不足 评价: 推荐 Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer techno...
System-on-Chip Test Architectures Multi-Processor System on Chip (MPSoC) platforms are becoming increasingly more heterogeneous and are shifting towards a more communication-centric methodo... R Ramadoss 被引量: 54发表: 2008年 An event-based network-on-chip monitoring service Networks on chip (NoC...