Jallot E, Benhayoune H, Kilian L, Irigaray JL, Oudadesse H, Balossier G, Bonhomme P. STEM and EDXS characterization of physicochemical reactions at the interface between a bioglass coating and bone. Surf Interface Anal 2000;29:314-320....
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JALLOT E, NEDELEC J M, GRIMAULT A S, CHASSOT E, GRANDJEAN-LAQUERRIERE A, LAQUERRIERE P, LAURENT-MAQUIN D. STEM and EDXS characterization of physico-chemical reactions at the periphery of sol-gel derived Zn-substituted hydroxyapatites during interactions with biological fluids [J]. Colloids ...
STEM and EDXS characterization of physicochemical reactions at the interface between a bioglass coating and bone. Surf Interface Anal 2000;29:314-320.Jallot E,Benhayoune H,Kilian L, et al.STEM and EDXS characterization of physicochemical reactions at the interface between a bioglass coating and...
Wu S,Van Daele,Willem J,et al.Structural analysis of silver halide cubic microcrystals with epitaxial or converision growth by STEM—EDX.Electron Microbeam Anal. 1992Wu S, Van Daele, Willem J, et al. Structural analysis of silver halide cubic microcrystals with epitaxial or converision growth...
Fate of Lu(III) sorbed on 2-line ferrihydrite at pH 5.7 and aged for 12 years at room temperature. II: insights from STEM-EDXS and DFT calculations.doi:10.1007/S11356-018-1904-7Tadahiro YokosawaEric PrestatRobert PollyMuriel Bouby
The power of STEM-EDX in revealing morphological features and distribution of various chemical components at nanometer scale was also highlighted. The analytical approach presented here will be valuable for the characterization of BC and the study of nanometer scale organic-mineral association in ...
Intergranular segregationPhosphorusGrain boundaryThis study describes a method to quantify phosphorus grain boundary segregation by Energy Dispersive X-ray Spectroscopy in Scanning Transmission Electron Microscope (STEM-EDX). A "box-type method" is employed, removing the long-discussed problems of ...
It also proposes a new methodology for EDX quantification using bulk standards in a STEM-in-SEM. The study highlights the increasing demand for analytical SRMs to support high-precision nanometrology in emerging nanotechnology fields.doi:10.1093/mam/ozae044.322Ritchie, Nich...