SrTiO3/SrRuO3薄膜 rTiO3基片表面约50nm厚度的SrRuO3 (~50nm)薄膜 (001)SrTiO3/SrRuO3样品的XRD图谱。 (001)SrTiO3/SrRuO3样品的微米区域AFM形貌,宏观区域可能有小颗粒。免责声明: 本站产品介绍内容(包括产品图片、产品描述、技术参数等)仅用于宣传用途,仅供参考。由于更新不及时和网站不可预知的BUG可能会...
多晶SrRuO3磁性的Preisach研究 维普资讯 http://www.cqvip.com
Conversely, no phase transformations of the TSRO thin film occurred within the range from RT to 250 °C. The octahedral RuO 6 rotation was strongly affected by the phase transformation in the SRO thin films.doi:10.3938/jkps.73.1529Lee, Sung Su...
Stinheceetlehcetrboonnidc aApstnorRdluyuc-COttuya3pRrmeeuasaOntnr3diuf(cemCtsuRtargtOehn)deebetpiposhemtyhnsdcieciaxnsnhgoibbfoeinetlrtteehhcmeetrasooryrnkntahtchboolerryshrideoslemdaptebietoniacnidl(sewo1n4-i,t2t)6ho–si2ftn9rt.uhtAhcetisuAsyr-nferst9aih,t1mee4,s1cei5aws,2to4oi,of...
Stinheceetlehcetrboonnidc aApstnorRdluyuc-COttuya3pRrmeeuasaOntnr3diuf(cemCtsuRtargtOehn)deebetpiposhemtyhnsdcieciaxnsnhgoibbfoeinetlrtteehhcmeetrasooryrnkntahtchboolerryshrideoslemdaptebietoniacnidl(sewo1n4-i,t2t)6ho–si2ftn9rt.uhtAhcetisuAsyr-nferst9aih,t1mee4,s1cei5aws,2to4oi,of...
SrRuO3 维普资讯 http://www.cqvip.com
pOenaktshoefotthheertyhpaen1d/,2{woohoe}n(tohsetaoncdtashfeodrroadadreinrotetgaeterd) occur in an in-phase manner, half-integer reflections However, these peaks are usually weak as oafctohnesetqyupeen1c/e2{ooof et}he(esmstaanlldastofomricevfoenrminftaecgteorr) are produced4. of oxygen...
Conversely, the phase transformation of TSRO thin films did not occur in the range from RT to 250 掳C.Okkyun SeoSung Su LeeJae Myung KimChulho SongSatoshi HiroiYanna ChenYoshio KatsuyaOsami Sakata2018年第79回応用物理学会秋季学術講演会講演予稿集: 第79回応用物理学会秋季学術講演会, 2018年9月...
The ferroelectric properties of the films were determined by the RT66A Standardized Ferroelectric Test System. The structural properties of the films were analyzed by X-ray diffraction. Transmission electron microscopy was used to determine the crystallinity and quality of interfaces among different layers...
Distribution of crystal structure along the thickness direction for the epitaxial Pb(Zr,Ti)O3 thick film on (111)cSrRuO3//(111)SrTiO3 substrate with Zr/(Zr + Ti) = 0.42 was investigated using micro-Raman spectroscopy. The XRD result showed that the Pb(Zr,Ti)O3 thick film consisted of ...