1) spreading resistance probe 扩展电阻探针法 例句>> 2) method of one probe spreading resistance 单探针扩展电阻法 3) Extented-Probe 扩展探针 4) resistance probe 电阻探针 1. With a view to the corrosion of the reinforcing steel bars in reinforced concrete,foil-gratingresistance probesamples and ...
展阻量测系统(Spreading Resistance Probe System)黄国华先生(第1代理人) 蔡庆祥先生(第2代理人) 组长 胡进章先生 协调技术 …www.src.nctu.edu.tw|基于29个网页 2. 展阻测量系统 预期成果 ... 真空溅镀系统B Sputter 展阻测量系统 Spreading Resistance Probe System 椭圆测试仪 Automatic Ellipsometer ... ...
probe n. [C] 1.探查工具; 探测器; (尤指医生用的)探子, 探针 2.航天探测器(一种不载人的宇宙飞船, 用以搜集有关宇宙的资料, 并发送回地球) 3.(尤作新闻用语)探究, 深入的调查 resistance n. 1.抵抗,反抗,抵抗能力 2.阻力 3.电阻,热阻 4.抗力;抵抗力 5.抵抗;反抗 6.(尤指敌占区的)秘密抵抗...
The two probes of a Spreading Resistance Profile (SRP) device are then placed in contact with the dopant regions of two cells in the same row of the matrix, the distance &Dgr;X between the probes being ma.sub.x, where m is an integer, and the total resistance R.sub.T between the ...
Vandervorst: Characterization of electrically active dopant profiles with the spreading resistance probe. Materials Science and Engineering R, 47:123 - 206, 2004.T. CLARYSSE ET AL. Characterization of electrically active dopant profiles with the spreading resistance probe. Materials Science and ...
1) spreading resistance 扩展电阻1. In this paper, the regularity of the changed dosage and the depth of strain, the injury layer, the spreading resistance when N~(+)and N~+_2 were pouring into Si, were investigated. 本文应用X射线衍射方法、红外光谱分析方法、扩展电阻测量方法研究了N+和N+...
Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe (Withdrawn 2003) 来自 掌桥科研 喜欢 0 阅读量: 13 标准号: ASTM F672-01 摘要: 本标准于2003年5月转移至SEMI(www.SEMI.org) 1.1本试验方法包括测量垂直于已知方向...
resistancen. 1.抵抗,反抗,抵抗能力 2.阻力 3.电阻,热阻 4.抗力;抵抗力 5.抵抗;反抗 6.(尤指敌占区的)秘密抵抗组织 Resistance阻挡区 wide spreadinga. 范围广阔的;流传很广的 De spreadingv (通信类词语)解扩 例句: De-spreading a signal 解扩信号 ...
The dopant profiles in silicon sample implanted by BF 2 are measured using secondary ion mass spectrometry (SIMS) and spreading resistance probe (SRP) techniques.Comparing with the results measured by SIMS and SRP at a suitable depth,the calibration constant of SIMS for boron dopant is got,then...
A system for automatic spreading resistance profiling of wafer specimens. The system comprises a positioning stage for positioning the specimens for contact by probe tips and alternately a probe conditioning fixture or a sample calibration fixture. The system further comprises a programmed computer for ...