A new nano-silica/chitosan (SiO2/CS) sorbent was created using a wet process to eliminate uranium(VI) from its solution. Measurements using BET, XRD, EDX, SEM, and FTIR were utilized to analyze the production of SiO2/CS. The adsorption progressions were
The XRD spectra were recorded using a powder X-ray Diffractometer (Rigaku RINT 2500, Rigaku Corporation, Tokyo, Japan) with Cu/Kα radiation at 30 mA and 40 kV. TGA was performed in nitrogen atmosphere from 40 to 800 ◦C with a heating rate of 10 ◦C/min with a simultaneous ...