The XRD patterns of the film exhibited sharp peaks. These peaks did not completely match the standard XRD patterns of neither bulk Si nor the starting material CaSi2, implying the formation of new crystalline phases. The sharp peak at 17.24° might correspond to the periodicity of modifier ...
additional peaks were discovered. The FTIR spectrum and spectrum pattern confirmed that the material's main component was SiO2, validating the correctness of the material used (Fig.S1E). FTIR analysis of Si-NPs revealed that the surface of the nanoparticles and their functional groups contained Si...
However, no typical peaks of Ru NPs were observed in XRD patterns, because of its low content (0.11 μmol·cm−2), as characterized by inductively coupled plasma-atomic emission spectroscopy (ICP-OES). The energy dispersive X-ray spectroscopy (EDS) mapping further validated that Ru NPs were...
observed the X-ray diffraction (XRD) peaks of crystalline Si at 28.4°, 47.3°, and 56.1° corresponding to the (111), (220), and (311) planes, respectively, for the deposit that was obtained by employing the liquid Ga cathode and [TBMA][TFSA] IL at 373 K [163]. The detection ...
FTIR spectra of Nano-Si at 793 and 1068 cm−1, sharp and strong peaks were observed (Fig. 1B). The XRD pattern and characteristic absorption peak of Nano-Si are illustrated in Fig. 1C. The Nano-Si spectra showed a broad peak in the 18–30° (2θ) range and the peak of the ...
Utlizing X-ray diffraction (XRD), we present results for the relative intensities of the XRD, we present results for the relative intensities of the XRD peaks originating from the (111), (220), (400) crystallographic planes as functions of CH/Hmake up during growth. SEM observations ...
This broadening could be due to diffractive effects happening at the edges and peaks of the pyramids, as found by Haug et al. and Yang et al.,52,53 which would increase the reflectance. Furthermore, for Recipes B–D, a portion of the pyramids are smaller than 300 nm and thus break ...
a, XRD patterns of the control, MA, PEA, t-BA films deposited on silicon substrates. The asterisk symbols denote the peaks of silicon. The perovskite reflections in the XRD pattern from the MA film are shifted to lower angles suggesting some MA+ incorporation into the A-site of the 3D pe...
(a) The TG-DSC curve of 3D printed Si3N4body; (b) The heating curves of 3D printed MS, GPS, and HPS Si3N4samples; (c) Comparison of XRD between 3D printed MS, GPS and HPS samples, all peaks correspond to those of a reference β-Si3N4(JCPDS 33-1160). ...
Peaks were observed in the XRD spectra for each of the Si films. The peak intensities were relatively weak, however, due to the thinness of the films. Both the control sample and the sample that had a capping seed layer 16 of poly-Ge exhibited only one peak corresponding to the {111} ...